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Issue Date
Title
Author(s)
2018
Effect of NBTI stress on DSP cores used in CE devices: Threat model and performance estimation
Kachave, Deepak
;
Sengupta, Anirban
;
Neema, Shubha
;
Harsha, Panugothu Sri
2018
Integrating compiler driven transformation and simulated annealing based floorplan for optimized transient fault tolerant DSP cores
Sengupta, Anirban
;
Kachave, Deepak
2018
Reliability and threat analysis of NBTI stress on DSP cores
Sengupta, Anirban
;
Kachave, Deepak
;
Neema, Shubha
;
Panugothu, Sri Harsha
2019
Fault-Tolerant DSP Core Datapath Against Omnidirectional Spatial Impact of SET
Kachave, Deepak
;
Sengupta, Anirban
Discover
Type of Material
2
Conference Paper
2
Journal Article
Author
2
Neema, Shubha
1
Harsha, Panugothu Sri
1
Panugothu, Sri Harsha
Subject
2
Degradation
2
Device degradation
2
Digital signal processing (DSP)
2
Failure (mechanical)
2
Fault tolerance
2
Negative bias temperature instabi...
2
Negative bias temperature instabi...
2
Performance comparison
2
Performance degradation
2
Reliability analysis
.
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Date issued
3
2018
1
2019