Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/11184
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dc.contributor.authorSharma, Nehaen_US
dc.date.accessioned2022-12-14T12:10:18Z-
dc.date.available2022-12-14T12:10:18Z-
dc.date.issued2022-
dc.identifier.citationSharma, P. K., Sharma, N., Dhok, S., & Singh, A. (2022). RIS-assisted FD short packet communication with non-linear EH. IEEE Communications Letters, , 1-1. doi:10.1109/LCOMM.2022.3223286en_US
dc.identifier.issn1089-7798-
dc.identifier.otherEID(2-s2.0-85142771070)-
dc.identifier.urihttps://doi.org/10.1109/LCOMM.2022.3223286-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/11184-
dc.description.abstractA multi-user full-duplex (FD) communication system is considered where each user is assisted by a dedicated reconfigurable intelligent surface (RIS). Through random scheduling scheme, one of the users is granted the resources to transmit and receive from a base station (BS). Each user is battery powered and deploys the hybrid non-linear power-time splitting energy harvesting (HNPEH) to meet its power requirements. The system performance is analyzed for the finite block length transmissions through block error rate (BLER) metric. Furthermore, the effects of parameters such as EH sensitivity and saturation, residual self interference (RSI), efficiency, reflection coefficient, etc. are analyzed. IEEEen_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceIEEE Communications Lettersen_US
dc.subjectFinite difference methoden_US
dc.subjectSignal to noise ratioen_US
dc.subjectBlock error ratesen_US
dc.subjectFull duplex communicationen_US
dc.subjectNon linearen_US
dc.subjectReconfigurableen_US
dc.subjectReconfigurable intelligent surfaceen_US
dc.subjectRelayen_US
dc.subjectRician channelsen_US
dc.subjectRician fadingen_US
dc.subjectSensitivityen_US
dc.subjectWireless communicationsen_US
dc.subjectEnergy harvestingen_US
dc.titleRIS-assisted FD Short Packet Communication with Non-linear EHen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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