Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/11428
Title: Y2O3-Based Crossbar Array for Analog and Neuromorphic Computation
Authors: Kumar, Sanjay Raj
Mukherjee, Shaibal
Keywords: Computation theory;Memristors;> <tex-math notation="LaTeX">$_{\text{2}}$</tex-math> </inline-formula>O<inline-formula xmlns:ali=";> <tex-math notation="LaTeX">$_{\text{3}}$</tex-math> </inline-formula>;Artificial synapse;Crossbar;Depression;Memristor;Neuromorphic;Neuromorphic computation;Spike-time dependent plasticities;Spike-time-dependent plasticity;Synapse;Writing;Xmlns:mml=";Xmlns:xlink=";Xmlns:xsi=";Y<inline-formula xmlns:ali=";Neurons
Issue Date: 2023
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Kumar, S., Kumbhar, D. D., Park, J. H., Kamat, R. K., Dongale, T. D., & Mukherjee, S. (2023). Y2O3-based crossbar array for analog and neuromorphic computation. IEEE Transactions on Electron Devices, 70(2), 473-477. doi:10.1109/TED.2022.3227890
Abstract: Here, we report an implementation of (8 × 8) Y2O3-based memristive crossbar array (MCA) out of a total dimension of (30 × 25) array fabricated by utilizing a dual ion beam sputtering (DIBS) system. The selected (8 × 8) MCA is further used to electrically write random alphabets and perform synaptic learning characteristics to perform analogand neuromorphiccomputingapplications.TheMCA effectively exhibits multiple current levels and mimics various artificial synaptic properties with superior bidirectional switching responses. The MCA mimics potentiation, depression, and different Hebbian learning-based spiketime- dependent plasticity rules, suggesting the importance of the Y2O3-based MCA for large-scale neuromorphic and analog computations. This work provides different insights into the design of an artificial synapse by utilizing Y2O3 as a switching oxide in memristors. © 1963-2012 IEEE.
URI: https://doi.org/10.1109/TED.2022.3227890
https://dspace.iiti.ac.in/handle/123456789/11428
ISSN: 0018-9383
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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