Please use this identifier to cite or link to this item:
https://dspace.iiti.ac.in/handle/123456789/11575
Title: | सटीक जांच के लिए आइआइटी इंदौर ने विकसित की 2-डी विधि |
Authors: | नईदुनिया | NaiDunia |
Keywords: | AI-based method for improving CT-Scans;Collaboration with KIIT University and Choithram Hospital and Research Centre;Research in IITI;Dr. Hem Chandra Jha;Dr. M. Tanveer |
Issue Date: | 13-Apr-2023 |
Publisher: | नईदुनिया (इंदौर) |
URI: | http://dspace.iiti.ac.in:8080/jspui/handle/123456789/11575 |
Type of Material: | Newspaper Clipping |
Appears in Collections: | 03_Year 2023 |
Files in This Item:
File | Description | Size | Format | |
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20230413_Nai_Dunia_P-2.pdf | 393.41 kB | Adobe PDF | View/Open |
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