Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/11900
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dc.contributor.authorKumar, Sanjayen_US
dc.contributor.authorGautam, Mohit Kumaren_US
dc.contributor.authorYadav, Saurabhen_US
dc.contributor.authorMukherjee, Shaibalen_US
dc.date.accessioned2023-06-20T15:35:51Z-
dc.date.available2023-06-20T15:35:51Z-
dc.date.issued2023-
dc.identifier.citationKumar, G., Yamalakonda, V. G., R, S., & Singh, A. K. (2023). Fractionally delayed bayesian approximation filtering under non-gaussian noisy environment. IEEE Transactions on Aerospace and Electronic Systems, , 1-11. doi:10.1109/TAES.2023.3266176en_US
dc.identifier.issn0018-9383-
dc.identifier.otherEID(2-s2.0-85153504456)-
dc.identifier.urihttps://doi.org/10.1109/TED.2023.3265622-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/11900-
dc.description.abstractHere, we report both memcapacitive and memristive behaviors in a Y2O3-based crossbar array size of (4 × 4), which is fabricated by utilizing dual ion beam sputtering (DIBS) system. The fabricated crossbar array shows the memcapacitive behavior under the application of lower input voltage, while under the comparatively higher input voltage, it shows memristive behavior in switching response. Moreover, the transition from memcapacitive to memristive behavior is stable and reversible in nature and depends on the amplitude of the applied input voltage. The crossbar array devices show stable switching response in multiple switching cycles, excellent endurance (80 000 cycles) and retention (12 × 103 s) properties, low device-to-device (D2D), and cycle-to-cycle (C2C) variabilities in device switching voltages, i.e., VSET and VRESET. The synaptic functionalities are demonstrated in terms of potentiation (P) and depression (D) mechanisms and achieve least value of nonlinearity factor, i.e., 0.05 under the lower input voltage (1 V), wherein memcapacitive behavior is dominated. © 1963-2012 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceIEEE Transactions on Electron Devicesen_US
dc.subjectCrossbaren_US
dc.subjectmemcapacitive-to-memristive transitionen_US
dc.subjectvariabilityen_US
dc.subjectyttriaen_US
dc.titleMemcapacitive to Memristive Transition in Al/Y2O3/GZO Crossbar Arrayen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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