Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/11964
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dc.contributor.authorBhatia, Vimalen_US
dc.date.accessioned2023-06-24T13:03:09Z-
dc.date.available2023-06-24T13:03:09Z-
dc.date.issued2023-
dc.identifier.citationHindustani, R. K., Dixit, D., Sharma, S., & Bhatia, V. (2023). Outage probability of multiple-IRS-assisted SISO wireless communications over rician fading. Physical Communication, 59 doi:10.1016/j.phycom.2023.102102en_US
dc.identifier.issn1874-4907-
dc.identifier.otherEID(2-s2.0-85160321485)-
dc.identifier.urihttps://doi.org/10.1016/j.phycom.2023.102102-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/11964-
dc.description.abstractOutage probability (OP) performance of multiple-intelligent reflecting surface (IRS)-assisted is presented for a practically important single-input-single-output (SISO) wireless communication system over Rician fading channels where the IRS panel selection is considered. We investigate the SISO wireless communication scenario in which a single antenna transmitting node is sending its message to the receiving node with the aid of the best IRS panel selection. This wireless communication scenario model is a typical application of the uplink scenarios for future cellular wireless systems. We derive approximate OP expressions in the closed form using both the central limit theorem and the Laguerre series expansion. Further, we also derive a simple asymptotic OP to get diversity order and coding gain. The influence of each system parameter on OP performance is thoroughly investigated. In addition, the analytical OP results are corroborated with simulated OP results to confirm the accuracy of our presented analytical results. © 2023 Elsevier B.V.en_US
dc.language.isoenen_US
dc.publisherElsevier B.V.en_US
dc.sourcePhysical Communicationen_US
dc.subjectCoding gainen_US
dc.subjectDiversity orderen_US
dc.subjectIntelligent reflecting surfaceen_US
dc.subjectOutage probabilityen_US
dc.subjectRician fading channelen_US
dc.subjectSingle-input–single-outputen_US
dc.titleOutage probability of multiple-IRS-assisted SISO wireless communications over Rician fadingen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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