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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bhatia, Vimal | en_US |
dc.date.accessioned | 2023-06-24T13:03:09Z | - |
dc.date.available | 2023-06-24T13:03:09Z | - |
dc.date.issued | 2023 | - |
dc.identifier.citation | Hindustani, R. K., Dixit, D., Sharma, S., & Bhatia, V. (2023). Outage probability of multiple-IRS-assisted SISO wireless communications over rician fading. Physical Communication, 59 doi:10.1016/j.phycom.2023.102102 | en_US |
dc.identifier.issn | 1874-4907 | - |
dc.identifier.other | EID(2-s2.0-85160321485) | - |
dc.identifier.uri | https://doi.org/10.1016/j.phycom.2023.102102 | - |
dc.identifier.uri | https://dspace.iiti.ac.in/handle/123456789/11964 | - |
dc.description.abstract | Outage probability (OP) performance of multiple-intelligent reflecting surface (IRS)-assisted is presented for a practically important single-input-single-output (SISO) wireless communication system over Rician fading channels where the IRS panel selection is considered. We investigate the SISO wireless communication scenario in which a single antenna transmitting node is sending its message to the receiving node with the aid of the best IRS panel selection. This wireless communication scenario model is a typical application of the uplink scenarios for future cellular wireless systems. We derive approximate OP expressions in the closed form using both the central limit theorem and the Laguerre series expansion. Further, we also derive a simple asymptotic OP to get diversity order and coding gain. The influence of each system parameter on OP performance is thoroughly investigated. In addition, the analytical OP results are corroborated with simulated OP results to confirm the accuracy of our presented analytical results. © 2023 Elsevier B.V. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Elsevier B.V. | en_US |
dc.source | Physical Communication | en_US |
dc.subject | Coding gain | en_US |
dc.subject | Diversity order | en_US |
dc.subject | Intelligent reflecting surface | en_US |
dc.subject | Outage probability | en_US |
dc.subject | Rician fading channel | en_US |
dc.subject | Single-input–single-output | en_US |
dc.title | Outage probability of multiple-IRS-assisted SISO wireless communications over Rician fading | en_US |
dc.type | Journal Article | en_US |
Appears in Collections: | Department of Electrical Engineering |
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