Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/12386
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dc.contributor.authorKiran, S. S.en_US
dc.contributor.authorMishra, Rahul Deven_US
dc.contributor.authorKumar, Santoshen_US
dc.contributor.authorJogi, Adityaen_US
dc.contributor.authorKumar, Mukeshen_US
dc.date.accessioned2023-11-03T12:30:09Z-
dc.date.available2023-11-03T12:30:09Z-
dc.date.issued2023-
dc.identifier.citationKiran, S., Mishra, R. D., Kumar, S., Jogi, A., Singh, L., & Kumar, M. (2023). Nano-scale optical guidance and control in finfet like structure. Optical and Quantum Electronics, 55(9). Scopus. https://doi.org/10.1007/s11082-023-05057-4en_US
dc.identifier.issn0306-8919-
dc.identifier.otherEID(2-s2.0-85163759538)-
dc.identifier.urihttps://doi.org/10.1007/s11082-023-05057-4-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/12386-
dc.description.abstractFinFET Structure is proposed as a nanophotonic platform to guide and control light. The hybrid plasmonic mode is made to guide in the dielectric layer around the silicon fin (channel). We are able to guide and control both TE and TM modes in the proposed structure which provides improved electrostatic control over the channel where the gate is wrapped around the Fin. By utilizing the gate and drain–source voltages we can control the charge carriers in the channel thereby realizing phase tuning. In addition, a voltage tunable absorption is also reported through the voltage variable imaginary part of the effective index. The proposed device can be well suited for applications in photonic devices at real nanoscales. © 2023, The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature.en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.sourceOptical and Quantum Electronicsen_US
dc.subjectEffective refractive indexen_US
dc.subjectFinFETen_US
dc.subjectHybrid plasmonic modeen_US
dc.subjectIntegrated CMOS-photonicsen_US
dc.titleNano-scale optical guidance and control in finfet like structureen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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