Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/13133
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dc.contributor.authorBhatia, Vimalen_US
dc.date.accessioned2024-01-29T05:19:15Z-
dc.date.available2024-01-29T05:19:15Z-
dc.date.issued2023-
dc.identifier.citationSingh, A., Sharma, S., Deka, K., & Bhatia, V. (2023). Deep Learning-Assisted OFDM Detection with Hardware Impairments. Journal of Communications and Information Networks. Scopus. https://doi.org/10.23919/JCIN.2023.10272364en_US
dc.identifier.issn2096-1081-
dc.identifier.otherEID(2-s2.0-85182391086)-
dc.identifier.urihttps://doi.org/10.23919/JCIN.2023.10272364-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/13133-
dc.description.abstract—This paper introduces a deep learning (DL) algorithm for estimating doubly-selective fading channel and detecting signals in orthogonal frequency division multiplexing (OFDM) communication systems affected by hardware impairments (HIs). In practice, hardware imperfections are present at the transceivers, which are modeled as direct current (DC) offset, carrier frequency offset (CFO), and in-phase and quadrature-phase (IQ) imbalance at the transmitter and the receiver in OFDM system. In HIs, the explicit system model could not be mathematically derived, which limits the performance of conventional least square (LS) or minimum mean square error (MMSE) estimators. Thus, we consider time–frequency response of a channel as a 2D image, and unknown values of the channel response are derived using known values at the pilot locations with DL-based image super-resolution, and image restoration techniques. Further, a deep neural network (DNN) is designed to fit the mapping between the received signal and transmit symbols, where the number of outputs equals to the size of the modulation order. Results show that there are no significant effects of HIs on channel estimation and signal detection in the proposed DL-assisted algorithm. The proposed DL-assisted detection improves the OFDM performance as compared to the conventional LS/MMSE under severe HIs. © 2023, Posts and Telecom Press Co Ltd. All rights reserved.en_US
dc.language.isoenen_US
dc.publisherPosts and Telecom Press Co Ltden_US
dc.sourceJournal of Communications and Information Networksen_US
dc.subjectchannel estimationen_US
dc.subjectDLen_US
dc.subjectHIsen_US
dc.subjectOFDMen_US
dc.subjectsignal detectionen_US
dc.titleDeep Learning-Assisted OFDM Detection with Hardware Impairmentsen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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