Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/14250
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dc.contributor.authorKumar, Kailash V.T.S.Pavanen_US
dc.contributor.authorRambadey, Omkar V.en_US
dc.contributor.authorSagdeo, Pankaj R.en_US
dc.date.accessioned2024-08-14T10:23:45Z-
dc.date.available2024-08-14T10:23:45Z-
dc.date.issued2024-
dc.identifier.citationKumar, K., Rambadey, O. V., & Sagdeo, P. R. (2024). Contribution of individual phonon to the band gap renormalization in semiconductors. Physica Scripta. https://doi.org/10.1088/1402-4896/ad5050en_US
dc.identifier.issn0031-8949-
dc.identifier.otherEID(2-s2.0-85195549363)-
dc.identifier.urihttps://doi.org/10.1088/1402-4896/ad5050-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/14250-
dc.description.abstractUnderstanding the origin of temperature-dependent bandgap in semiconductors is essential for their applications in photovoltaics, optoelectronic and space applications. In this regard the electron-phonon coupling is known to play a crucial role in the temperature dependence of the bandgap of semiconductors. Several models have also been proposed in this regard which are also found experimentally compatibleen_US
dc.description.abstracthowever, these models need to account for more information about the contribution of individual modes in band gap renormalization. The present report is an analytical attempt to do so by utilizing the Bose-Einstein oscillator model, thereby discussing a method for finding the individual renormalization term contributed by respective phonon modes to the overall bandgap. This study contributes to the fundamental understanding of the temperature variation of optical properties of semiconductors that correlates with the role of electron-phonon interaction. © 2024 IOP Publishing Ltd.en_US
dc.language.isoenen_US
dc.publisherInstitute of Physicsen_US
dc.sourcePhysica Scriptaen_US
dc.subjectbandgapen_US
dc.subjectphononen_US
dc.subjectsemiconductoren_US
dc.titleContribution of individual phonon to the band gap renormalization in semiconductorsen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Physics

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