Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/15541
Title: Blind Interleaver Classification Using Deep Learning Techniques over Rayleigh Fading
Authors: Ahamed, Nayim
Ramabadran, Swaminathan
Keywords: Blind identification;classification accuracy;CNN model;deep learning;hybrid CNN-SVM;interleaver;Rayleigh fading
Issue Date: 2024
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Ahamed, N., Ramabadran, S., & Yepuri, S. R. (2024). Blind Interleaver Classification Using Deep Learning Techniques over Rayleigh Fading. Proceedings of 2024 IEEE 29th Asia Pacific Conference on Communications: Sustainable Connectivity: Advancing Green Technologies for a Smarter Future, APCC 2024. Scopus. https://doi.org/10.1109/APCC62576.2024.10768080
Abstract: Channel encoders and interleavers are crucial for correcting random and burst errors introduced by noisy channels in digital communication systems. Typically, information about the types of channel encoders and interleavers, along with their parameters used at the transmitting end, is available at the receiver. However, in military communication systems, the encoder/interleaver type and parameters are often partially known or unknown. In reconfigurable receivers and adaptive modulation and coding (AMC)-based systems, blind identification of channel encoders and interleavers enhances spectral efficiency. This paper explores the use of a deep learning approach to identify three different types of interleavers namely block, convolutional, and helical, under Rayleigh fading conditions. We propose a hybrid convolutional neural network (CNN)- support vector machine (SVM) model for classification, with input data consisting of block-encoded and convolutional-encoded data. Our hybrid CNN-SVM model achieves over 9 5 % classification accuracy across varying signal-to-noise ratio (SNR) values. The findings also show that accuracy improves with longer input sample lengths, albeit at the cost of increased training and testing time. Finally, our proposed model demonstrates superior classification accuracy compared to the CNN model. © 2024 IEEE.
URI: https://doi.org/10.1109/APCC62576.2024.10768080
https://dspace.iiti.ac.in/handle/123456789/15541
Type of Material: Conference Paper
Appears in Collections:Department of Electrical Engineering

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: