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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Vamsi, Koruprolu Venkata | en_US |
dc.date.accessioned | 2025-02-04T14:30:53Z | - |
dc.date.available | 2025-02-04T14:30:53Z | - |
dc.date.issued | 2024 | - |
dc.identifier.citation | Long, Z., Bürger, D., Dolle, C., Dai, Y., Vamsi, K. V., & Eggeler, Y. M. (2024). Segregation to Creep-induced Planar Faults in Ni-base Single Crystal Superalloys. Microscopy and Microanalysis. Scopus. https://doi.org/10.1093/mam/ozae044.625 | en_US |
dc.identifier.issn | 1431-9276 | - |
dc.identifier.other | EID(2-s2.0-85215658039) | - |
dc.identifier.uri | https://doi.org/10.1093/mam/ozae044.625 | - |
dc.identifier.uri | https://dspace.iiti.ac.in/handle/123456789/15645 | - |
dc.description.abstract | [No abstract available] | en_US |
dc.language.iso | en | en_US |
dc.publisher | Oxford University Press | en_US |
dc.source | Microscopy and Microanalysis | en_US |
dc.title | Segregation to Creep-induced Planar Faults in Ni-base Single Crystal Superalloys | en_US |
dc.type | Conference Paper | en_US |
Appears in Collections: | Department of Metallurgical Engineering and Materials Sciences |
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