Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/15645
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dc.contributor.authorVamsi, Koruprolu Venkataen_US
dc.date.accessioned2025-02-04T14:30:53Z-
dc.date.available2025-02-04T14:30:53Z-
dc.date.issued2024-
dc.identifier.citationLong, Z., Bürger, D., Dolle, C., Dai, Y., Vamsi, K. V., & Eggeler, Y. M. (2024). Segregation to Creep-induced Planar Faults in Ni-base Single Crystal Superalloys. Microscopy and Microanalysis. Scopus. https://doi.org/10.1093/mam/ozae044.625en_US
dc.identifier.issn1431-9276-
dc.identifier.otherEID(2-s2.0-85215658039)-
dc.identifier.urihttps://doi.org/10.1093/mam/ozae044.625-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/15645-
dc.description.abstract[No abstract available]en_US
dc.language.isoenen_US
dc.publisherOxford University Pressen_US
dc.sourceMicroscopy and Microanalysisen_US
dc.titleSegregation to Creep-induced Planar Faults in Ni-base Single Crystal Superalloysen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Metallurgical Engineering and Materials Sciences

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