Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/15742
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dc.contributor.authorSainadh, Patinavalasa Meghen_US
dc.contributor.authorJames, Sneha Kanjickalen_US
dc.contributor.authorGhosh, Saptarshien_US
dc.date.accessioned2025-03-03T17:00:45Z-
dc.date.available2025-03-03T17:00:45Z-
dc.date.issued2024-
dc.identifier.citationSainadh, P. M., James, S. K., & Ghosh, S. (2024). A Parallel Plate Waveguide Measurement Technique for Characterizing Frequency Selective Surfaces. ISAP 2024 - International Symposium on Antennas and Propagation. https://doi.org/10.1109/ISAP62502.2024.10846496en_US
dc.identifier.otherEID(2-s2.0-85218208668)-
dc.identifier.urihttps://doi.org/10.1109/ISAP62502.2024.10846496-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/15742-
dc.description.abstractThis paper presents a parallel plate waveguide (PPW) system to characterize frequency selective surfaces (FSSs) in microwave frequencies. The setup includes two metallic sheets placed parallel to each other with a feeding source at each end that provides a wideband impedance matching. The dimensions of the sheet have been varied gradually to minimize the edge radiation effect, whereas the thru-reflect-line (TRL) calibration technique has been carried out for accurate measurement. Three different FSS geometries, one bandstop, one bandpass, and one broadband absorber have been considered, and their scattering parameters have been determined. The responses have been compared with those of the unit cell simulated responses, and good agreement are observed in all cases, thereby validating the effectiveness and accuracy of the proposed PPW system. © 2024 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceISAP 2024 - International Symposium on Antennas and Propagationen_US
dc.subjectbandpassen_US
dc.subjectbandstopen_US
dc.subjectFrequency selective surface (FSS)en_US
dc.subjectparallel plate waveguideen_US
dc.subjectthru-reflect-lineen_US
dc.titleA Parallel Plate Waveguide Measurement Technique for Characterizing Frequency Selective Surfacesen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Electrical Engineering

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