Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/15806
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dc.contributor.authorChauhan, Puspraj Singhen_US
dc.contributor.authorBhatia, Vimalen_US
dc.date.accessioned2025-03-26T09:59:09Z-
dc.date.available2025-03-26T09:59:09Z-
dc.date.issued2025-
dc.identifier.citationChauhan, P. S., Sau, P. C., Kumar, S., Jain, A., & Bhatia, V. (2025). SEP analysis on the κ-μ shadowed fading with additive Laplacian noise. Digital Signal Processing: A Review Journal, 161. https://doi.org/10.1016/j.dsp.2025.105135en_US
dc.identifier.issn1051-2004-
dc.identifier.otherEID(2-s2.0-86000366201)-
dc.identifier.urihttps://doi.org/10.1016/j.dsp.2025.105135-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/15806-
dc.description.abstractThrough this correspondence, we present a theoretical framework for assessing the functionality of communication systems when operating over the family of κ-μ shadowed fading impacted by additive Laplacian noise. In this context, we have addressed the κ-μ shadowed Type-I, κ-μ shadowed Type-II and κ-μ shadowed Type-III fading channels and analyzed the impact of various shadowing types on the performance metrics of the communication systems. This study also examines the error probability for binary phase shift keying, quadrature phase shift keying, and M-ary phase shift keying. We have also derived generalized solutions to the moment-generating functions. In addition, we conducted an analysis of the shadowing impact using the probability density function and error probability. Furthermore, low complex approximate expressions for the error probability are presented. We additionally corroborate the theoretical results with numerical and Monte-Carlo simulations. © 2025 Elsevier Inc.en_US
dc.language.isoenen_US
dc.publisherElsevier Inc.en_US
dc.sourceDigital Signal Processing: A Review Journalen_US
dc.subjectBit error rateen_US
dc.subjectFadingen_US
dc.subjectLaplacian noiseen_US
dc.subjectMoment generating functionen_US
dc.titleSEP analysis on the κ-μ shadowed fading with additive Laplacian noiseen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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