Please use this identifier to cite or link to this item:
https://dspace.iiti.ac.in/handle/123456789/16163
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Navale, Ketan S. | en_US |
dc.contributor.author | Basak, Diptanshu | en_US |
dc.contributor.author | Yadav, Ekta | en_US |
dc.contributor.author | Mavani, Krushna R. | en_US |
dc.date.accessioned | 2025-05-28T05:23:27Z | - |
dc.date.available | 2025-05-28T05:23:27Z | - |
dc.date.issued | 2025 | - |
dc.identifier.citation | Navale, K. S., Basak, D., Yadav, E., & Mavani, K. R. (2025). Strongly emerging octahedral modifications with Al doping and its influence on the electronic transport in NdNiO<inf>3</inf>thin films. Journal of Physics. Condensed Matter : An Institute of Physics Journal, 37(22). https://doi.org/10.1088/1361-648X/add2be | en_US |
dc.identifier.issn | 0953-8984 | - |
dc.identifier.other | EID(2-s2.0-105004950195) | - |
dc.identifier.uri | https://doi.org/10.1088/1361-648X/add2be | - |
dc.identifier.uri | https://dspace.iiti.ac.in/handle/123456789/16163 | - |
dc.description.abstract | The temperature-dependent electronic transport and the metal-insulator transition in ABO3 perovskite-type NdNiO3 are highly sensitive to chemical substitutions and lattice-mismatch induced strain in thin films. We synthesized two series of NdNi1-xAlxO3 (x = 0-0.50) thin films on LAO (001) single crystal substrates using the pulsed laser deposition technique: one with varied Al doping level (x = 0-0.50) and the other with fixed doping (x = 0.5) but different thickness (10-200 nm). Substituting Al at Ni-site modifies the Ni oxidation state, as observed by x-ray photoelectron spectroscopy. A Raman mode around 693 cm−1 emerges with just 2% Al-doping at the Ni-site, which is otherwise absent in undoped NdNiO3 film. This mode is associated with an anti-stretching of BO6 octahedra in perovskites. With increasing doping, this mode strongly emerges in a dominating manner in the spectra, clearly indicating a further enhancement of octahedral anti-stretching. This mode exhibits a blue shift with increasing Al doping and a red shift with increasing thickness at x = 0.50. Temperature-dependent Raman spectra, analyzed using Balkanski and Grüneisen models, reveal anharmonicity and Red-shifting behaviors. The undoped film shows a metal-to-insulator transition temperature (TMI) of ∼77 K, which systematically increases with greater anti-stretching of octahedra and Al doping. At higher doping levels (x = 0.20 and 0.50), the films show insulating behavior below room temperature. As the thickness of NdNi0.50Al0.50O3 films varies from 10 nm to 200 nm, the anti-stretching mode got affected, resulting in systematic decrease in resistivity. Our findings confirm that the anti-stretching mode arises by Al doping, and it is associated with the insulating behavior of Al-doped NdNiO3 thin films. © 2025 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Institute of Physics | en_US |
dc.source | Journal of Physics Condensed Matter | en_US |
dc.subject | metal-insulator transition | en_US |
dc.subject | octahedra | en_US |
dc.subject | perovskite | en_US |
dc.subject | pulsed laser deposition | en_US |
dc.subject | Raman spectroscopy | en_US |
dc.subject | thin films | en_US |
dc.title | Strongly emerging octahedral modifications with Al doping and its influence on the electronic transport in NdNiO3 thin films | en_US |
dc.type | Journal Article | en_US |
Appears in Collections: | Department of Physics |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Altmetric Badge: