Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/16258
Title: Secrecy Sum-Rate Maximization and Symbol Detection for OSTAR-RIS Assisted VLC System
Authors: Sharma, Anupma
Bhatia, Vimal
Keywords: long short-term memory;optical simultaneously transmitting and reflecting intelligent surface;particle swarm optimization;Visible light communication
Issue Date: 2025
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Sharma, A., Singh, K., Bhatia, V., & Li, C.-P. (2025). Secrecy Sum-Rate Maximization and Symbol Detection for OSTAR-RIS Assisted VLC System. IEEE Wireless Communications and Networking Conference, WCNC. https://doi.org/10.1109/WCNC61545.2025.10978649
Abstract: Visible light communication (VLC) is an energy-efficient, green, and low-cost technology for high-speed next-generation communication systems. However, it has been observed that the performance of a VLC-based system is limited due to the light-emitting diode's (LED) nonlinear characteristics, low coverage area, and loss of the VLC signal due to the absence of a direct link between the transmitter and receiver caused by blockages present in the environment. In addition, the secrecy sum rate (SSR) of a VLC system is compromised due to the presence of an eavesdropper. To address the problem of dead zones and low coverage area, an optical simultaneously transmitting and reflecting intelligent surface (OSTAR-RIS) is proposed in the literature. For SSR maximization, the particle swarm optimization (PSO) method is employed and compared with the benchmark exhaustive search method. For implicit channel estimation and direct symbol detection, an LSTM-based algorithm for a nonlinear OSTAR-RIS VLC system is proposed. Simulations indicate superiority of the proposed optimization and implicit channel estimation technique over benchmark schemes. © 2025 IEEE.
URI: https://dx.doi.org/10.1109/WCNC61545.2025.10978649
https://dspace.iiti.ac.in:8080/jspui/handle/123456789/16258
ISSN: 1525-3511
Type of Material: Conference Paper
Appears in Collections:Department of Electrical Engineering

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