Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/16303
Title: Area-Optimized 2D Interleaved Adder Tree Design for Sparse DCIM Edge Processing
Authors: Sankhe, Akash
Lokhande, Mukul
Sharma, Radheshyam
Vishvakarma, Santosh Kumar
Keywords: Compute-in-memory (CIM);DNN (deep neural networks);Edge-AI accelerators;multiply-and-accumulate;reconfigurable precision
Issue Date: 2025
Publisher: IEEE Computer Society
Citation: Sankhe, A., Lokhande, M., Sharma, R., & Vishvakarma, S. K. (2025). Area-Optimized 2D Interleaved Adder Tree Design for Sparse DCIM Edge Processing. Proceedings International Symposium on Quality Electronic Design Isqed. https://doi.org/10.1109/ISQED65160.2025.11014431
Abstract: Recently, SRAM-embedded compute-in-memory (CIM) hardware has emerged as a promising solution to mitigate von-Neumann bottlenecks and has shown noteworthy improvements in energy efficiency and throughput for matrix-vector multiplication, a significant portion of neural networks. While PVT variations significantly impact traditional analog/mixed-signal (AMS) macros, the DCIM macros are more robust. This article proposes a DCIM macro that incorporates an 8-transistor SRAM bitcell capable of performing 1-bit multiplications and addressing the bit-flip issue arising from the simultaneous activation of multiple array rows. The macro also includes a 2D interleaved adder tree constructed using a novel 7T-based ripple carry adder (RCA), significantly reducing the adder tree's area. The proposed 16Kb DCIM macro computes 64 parallel products in a single clock cycle. It demonstrates 2 × higher energy efficiency than recent state-of-the-art works at 65nm CMOS. The macro is validated at 250MHz and achieves the classification accuracy of 98.7%, 98.8% for 1A4W precision, and 99.1%, 97.8% for 4A4W precision, for LeNet-5 architecture using MNIST and A-Z alphabet datasets respectively. © 2025 IEEE.
URI: https://dx.doi.org/10.1109/ISQED65160.2025.11014431
https://dspace.iiti.ac.in:8080/jspui/handle/123456789/16303
ISSN: 1948-3287
Type of Material: Conference Paper
Appears in Collections:Department of Electrical Engineering

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