Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/16377
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dc.contributor.authorAdoni, Chinmayien_US
dc.contributor.authorSemwal, Sandeepen_US
dc.date.accessioned2025-07-09T13:47:59Z-
dc.date.available2025-07-09T13:47:59Z-
dc.date.issued2025-
dc.identifier.citationAdoni, C., Semwal, S., Gupta, M., Raskin, J.-P., & Krant, A. (2025). Electrical Tunability in 3-Gated Reconfigurable Transistor for Analog/RF Applications. IEEE Journal of the Electron Devices Society. https://doi.org/10.1109/JEDS.2025.3581677en_US
dc.identifier.issn2168-6734-
dc.identifier.otherEID(2-s2.0-105008959909)-
dc.identifier.urihttps://dx.doi.org/10.1109/JEDS.2025.3581677-
dc.identifier.urihttps://dspace.iiti.ac.in:8080/jspui/handle/123456789/16377-
dc.description.abstractThe potential of electrical tunability in a 3-gated (3G) Reconfigurable Field Effect Transistor (RFET) for analog/RF applications is investigated through four distinct configurations (R2-IG-LVT, R1-IG-Ambi, R3-IG-LVT, and R2-IG-HVT). The electrical connections through two program gates (PG) and one control gate (CG) in 3G-RFET supports the implementation of configurations suitable for low-VTH (R2-IG-LVT and R3-IG-LVT) and high-VTH (R2-IGHVT), phase follower/reversal (R2-IG-LVT), frequency doubler (R1-IGAmbi), high gain (R3-IG-LVT), lower parasitic capacitance (R2-IG-LVT and R3-IG-LVT), and higher linearity (R3-IG-LVT) applications. Results showcase electrical tunability as an opportunity to realize many analog/RF features–in–one nanoscale 3G-RFET. © 2013 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceIEEE Journal of the Electron Devices Societyen_US
dc.subjectAnalog/RFen_US
dc.subjectCutoff frequencyen_US
dc.subjectFrequency/Phase modulationen_US
dc.subjectGainen_US
dc.subjectLinearityen_US
dc.subjectReconfigurable transistoren_US
dc.titleElectrical Tunability in 3-Gated Reconfigurable Transistor for Analog/RF Applicationsen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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