Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/17814
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dc.contributor.authorLakhara, Aartien_US
dc.contributor.authorBhobe, P. A.en_US
dc.date.accessioned2026-02-10T15:50:11Z-
dc.date.available2026-02-10T15:50:11Z-
dc.date.issued2025-
dc.identifier.citationLakhara, A., Thole, L., Haug, R. J., & Bhobe, P. A. (2025). Anomalous electrical transport in SnSe2 nanosheets: Role of thickness and surface defect states. Physical Review B, 112(23). https://doi.org/10.1103/hrp5-pts7en_US
dc.identifier.issn2469-9950-
dc.identifier.otherEID(2-s2.0-105027385095)-
dc.identifier.urihttps://dx.doi.org/10.1103/hrp5-pts7-
dc.identifier.urihttps://dspace.iiti.ac.in:8080/jspui/handle/123456789/17814-
dc.description.abstractThis work examines the influence of thickness on the electrical transport properties of mechanically exfoliated two-dimensional SnSe<inf>2</inf> nanosheets, derived from the bulk single crystal. Contrary to the conventional trend observed in two-dimensional systems, we find a semiconducting to metallic resistivity behavior with decreasing thickness. The analysis of low-temperature conduction indicates an increased density of states at the Fermi level with decreasing thickness, which is further corroborated by gate bias-dependent conductance measurement. The enhanced conductivity in thinner flake is attributed to the n-type doping arising from surface defect states. The presence and evolution of these defect states with thickness are probed by thickness-dependent room-temperature Raman spectroscopy. Our study provides insights into the thickness-dependent electronic transport mechanism of SnSe<inf>2</inf> and the crucial role of defect states in governing the observed conductivity behavior. © (2025), (American Physical Society). All rights reserved.en_US
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.sourcePhysical Review Ben_US
dc.titleAnomalous electrical transport in SnSe2 nanosheets: Role of thickness and surface defect statesen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Physics

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