Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/18275
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dc.contributor.authorSankhe, Akashen_US
dc.contributor.authorLokhande, Mukulen_US
dc.contributor.authorDhakad, Narendra Singhen_US
dc.contributor.authorSharma, Radheshyamen_US
dc.contributor.authorVishvakarma, Santosh Kumaren_US
dc.date.accessioned2026-05-14T12:28:21Z-
dc.date.available2026-05-14T12:28:21Z-
dc.date.issued2026-
dc.identifier.citationSankhe, A., Lokhande, M., Dhakad, N. S., Sharma, R., & Vishvakarma, S. K. (2026). RAPID: Re-configurable Adder Tree based Performance-Incentivized AI Digital CIM Macro. IEEE Transactions on Nanotechnology. https://doi.org/10.1109/TNANO.2026.3680063en_US
dc.identifier.issn1536-125X-
dc.identifier.otherEID(2-s2.0-105034679759)-
dc.identifier.urihttps://dx.doi.org/10.1109/TNANO.2026.3680063-
dc.identifier.urihttps://dspace.iiti.ac.in:8080/jspui/handle/123456789/18275-
dc.description.abstractRapidly rising AI applications have driven the need for energy-efficient, high-throughput SRAM-embedded Compute-in-Memory (CIM) macros. This article proposes RAPID-CIM, a reconfigurable digital CIM featuring an M8T bit cell and an area-efficient hierarchical adder tree, which addresses performance limitations in state-of-the-art (SoTA) designs. The proposed architecture achieves a maximum 16.7× improvement in energy efficiency and an 8.6× increase in compute density compared to SoTA designs at CMOS 65nm. RAPID-CIMachieves superior performance for diverse AI workloads with scalable bit precision and sparsity-aware operations, reducing up to 3.2× operation cycles and a 30% memory bank usage and application accuracy within 97.85% Quality of Results (QoR). Thus, the proposed solution is a well-versed optimisation for resource constrained Edge-AI platforms. © 2002-2012 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceIEEE Transactions on Nanotechnologyen_US
dc.titleRAPID: Re-configurable Adder Tree based Performance-Incentivized AI Digital CIM Macroen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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