Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/18281
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dc.contributor.authorTrivedi, Vasundharaen_US
dc.contributor.authorVishvakarma, Santosh Kumaren_US
dc.date.accessioned2026-05-14T12:28:21Z-
dc.date.available2026-05-14T12:28:21Z-
dc.date.issued2026-
dc.identifier.citationTrivedi, V., & Vishvakarma, S. K. (2026). ACSAM: Accuracy-configurable Segmentation-based Approximate Multiplier for Error-resilient Edge-AI Applications. IEEE Embedded Systems Letters. https://doi.org/10.1109/LES.2026.3676574en_US
dc.identifier.issn1943-0663-
dc.identifier.otherEID(2-s2.0-105034162793)-
dc.identifier.urihttps://dx.doi.org/10.1109/LES.2026.3676574-
dc.identifier.urihttps://dspace.iiti.ac.in:8080/jspui/handle/123456789/18281-
dc.description.abstractApproximate computing has introduced a paradigm shift in hardware-optimized implementation of Edge-AI applications by balancing accuracy and area constraints simultaneously. In this work, a hardware-efficient, segmentation-based 16-bit approximate multiplier, ACSAM is presented for resource-constrained applications with error tolerance capabilities. The proposed 16-bit multiplier integrates various combinations of conventional and proposed 8-bit approximate multipliers with unique shifting and rounding strategies. The proposed multiplier ACSAM achieved upto 18.9% improvement in LUT utilisation on FPGA and upto 2.85× reduction in power and upto 12.27% reduction in area for ASIC implementation on 65nm technology node compared to the state-of-the-art works. ACSAM is validated using an image-blurring application to demonstrate its suitability for DSP and image-processing tasks. Additionally, FPGA and ASIC evaluations confirm its adaptability across diverse implementation requirements. © 2009-2012 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceIEEE Embedded Systems Lettersen_US
dc.titleACSAM: Accuracy-configurable Segmentation-based Approximate Multiplier for Error-resilient Edge-AI Applicationsen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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