Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/18711
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dc.contributor.authorYadav, Saurabhen_US
dc.contributor.authorMahapatra, Brahmaduttaen_US
dc.contributor.authorHindoliya, Lokesh Kumaren_US
dc.contributor.authorMukherjee, Shaibalen_US
dc.date.accessioned2026-07-09T06:48:19Z-
dc.date.available2026-07-09T06:48:19Z-
dc.date.issued2026-
dc.identifier.citationYadav, S., Mahapatra, B., Hindoliya, L. K., Halder, A., Iyer, S. B., & Mukherjee, S. (2026). TomatoCare: A Mobile Deep Learning System for Leaf Disease Detection. 10th IEEE Electron Devices Technology and Manufacturing Conference: Emerging Semiconductor Devices and Manufacturing Technologies, EDTM 2026. https://doi.org/10.1109/EDTM65772.2026.11496959en_US
dc.identifier.isbn979-833158598-3-
dc.identifier.otherEID(2-s2.0-105040807095)-
dc.identifier.urihttps://dx.doi.org/10.1109/EDTM65772.2026.11496959-
dc.identifier.urihttps://dspace.iiti.ac.in:8080/jspui/handle/123456789/18711-
dc.description.abstractTomato crops are highly vulnerable to leaf diseases, which can cause major yield losses if not detected early. In this work, we present a mobile application that helps farmers identify tomato leaf diseases quickly and reliably. The system uses a three-stage deep learning pipeline: YOLOv8 for detecting leaves in images, a lightweight CNN model for checking if leaves are healthy or diseased, and a multi-class CNN for identifying the exact disease. A simple question-based verification step further improves trust in predictions. Designed for offline use, the app delivers accurate, fast, and farmer-friendly disease diagnosis directly on smartphones. © 2026 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.source10th IEEE Electron Devices Technology and Manufacturing Conference: Emerging Semiconductor Devices and Manufacturing Technologies, EDTM 2026en_US
dc.titleTomatoCare: A Mobile Deep Learning System for Leaf Disease Detectionen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Electrical Engineering

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