Please use this identifier to cite or link to this item:
https://dspace.iiti.ac.in/handle/123456789/2297
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sengupta, Anirban | en_US |
| dc.date.accessioned | 2020-06-25T11:55:59Z | - |
| dc.date.available | 2020-06-25T11:55:59Z | - |
| dc.date.issued | 2019 | - |
| dc.identifier.citation | Sengupta, A., Dasgupta, S., Singh, V., Sharma, R., & Vishvakarma, S. K. (2019). VLSI design and test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019: revised selected papers. Springer Nature. | en_US |
| dc.identifier.uri | http://koha.iiti.ac.in/cgi-bin/koha/opac-detail.pl?biblionumber=45048 | - |
| dc.identifier.uri | https://dspace.iiti.ac.in/handle/123456789/2297 | - |
| dc.description.abstract | This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Springer Nature | en_US |
| dc.subject | Computer Science & Engineering | en_US |
| dc.title | VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Department of Computer Science and Engineering | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Anirban_Sengupta_9789813297661.jpg Restricted Access | 39.98 kB | JPEG | View/Open Request a copy |
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