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https://dspace.iiti.ac.in/handle/123456789/3770
| Title: | Structural and mechanical characterization of Si doped ZnO |
| Authors: | Nasir, Mohd Farooq Rini, E. G. Sandhu, Pritpal Kaur Malu, Siddarth Savyasachi Kumar, Sunil Shirage, Parasharam Maruti Sen, Somaditya |
| Keywords: | II-VI semiconductors;Microhardness;Silicon;Size determination;Sol-gel process;Sol-gels;Structural properties;Zinc oxide;Zinc sulfide;Indentation size effects;Microhardness tests;Polycrystalline powders;Proportional specimen resistances;Single phase;Structural and mechanical characterizations;Structural complexity;Wurtzite structure;Silicon compounds |
| Issue Date: | 2017 |
| Publisher: | American Scientific Publishers |
| Citation: | Bajpai, G., Nasir, M., Rini, E. G., Sandhu, P. K., Malu, S., Kumar, S., . . . Sen, S. (2017). Structural and mechanical characterization of si doped ZnO. Journal of Nanoscience and Nanotechnology, 17(3), 1806-1812. doi:10.1166/jnn.2017.13020 |
| Abstract: | Zn1-xSixO polycrystalline powders with 0 ≤ x ≤ 0.12 were prepared by sol-gel method. Structural properties reveal single phase wurtzite structure for x ≤ 0.03 beyond which structural complexities arise. Micro hardness decreases with increase in Si content. Micro-hardness test reveals Indentation Size Effect. The experimental results were analysed using the Meyer's law, Proportional Specimen Resistance (PSR), Elastic/Plastic Deformation (EPD) models and Hays-Kendall approach. The Indentation Size Effect was also observed. Copyright © 2017 American Scientific Publishers All rights reserved. |
| URI: | https://doi.org/10.1166/jnn.2017.13020 https://dspace.iiti.ac.in/handle/123456789/3770 |
| ISSN: | 1533-4880 |
| Type of Material: | Journal Article |
| Appears in Collections: | Department of Astronomy, Astrophysics and Space Engineering |
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