Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/4661
Title: Construction of multi-class classifiers by Extreme Learning Machine based one-class classifiers
Authors: Gautam, Chandan
Tiwari, Aruna
Ravindran, Sriram
Keywords: Knowledge acquisition;Learning systems;Benchmark datasets;Extreme learning machine;Generalization capability;Model Selection;Multi-class classifier;One-class classifier;Optimal parameter;Synthetic datasets;Classification (of information)
Issue Date: 2016
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Gautam, C., Tiwari, A., & Ravindran, S. (2016). Construction of multi-class classifiers by extreme learning machine based one-class classifiers. Paper presented at the Proceedings of the International Joint Conference on Neural Networks, , 2016-October 2001-2007. doi:10.1109/IJCNN.2016.7727445
Abstract: Construction of multi-class classifiers using homogeneous combination of Extreme Learning Machine (ELM) based one-class classifiers have been proposed in this paper. Each class has been trained using individual one-class classifier and any new sample will belong to that class, which will yield maximum value. Proposed methods can be used to detect unknown outliers using multi-class classifiers. Two recently proposed one-class classifiers viz., kernel and random feature mapping based one-class ELM, is extended for multi-class construction in this paper. Further, we construct one-class classifier based multi-class classifier in two ways: with rejection and without rejection of few samples during training. We also perform consistency based model selection for optimal parameters selection in one-class classifier. We have tested the generalization capability of the proposed classifiers on 6 synthetic datasets and two benchmark datasets. © 2016 IEEE.
URI: https://doi.org/10.1109/IJCNN.2016.7727445
https://dspace.iiti.ac.in/handle/123456789/4661
ISBN: 9781509006199
Type of Material: Conference Paper
Appears in Collections:Department of Computer Science and Engineering

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: