Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/4907
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dc.contributor.authorKachave, Deepaken_US
dc.contributor.authorSengupta, Anirbanen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:35:59Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:35:59Z-
dc.date.issued2019-
dc.identifier.citationKachave, D., & Sengupta, A. (2019). Fault-tolerant DSP core datapath against omnidirectional spatial impact of SET. Canadian Journal of Electrical and Computer Engineering, 42(2), 102-107. doi:10.1109/CJECE.2019.2897624en_US
dc.identifier.issn0840-8688-
dc.identifier.otherEID(2-s2.0-85068220761)-
dc.identifier.urihttps://doi.org/10.1109/CJECE.2019.2897624-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/4907-
dc.description.abstractFault due to the single-event transient (SET) on digital signal processing (DSP) cores has not been thoroughly studied in the research community. Moreover, as the technology scaling becomes more intense, the impact of transient fault now becomes visible both in temporal and spatial domains. Few techniques have been presented in the literature that simultaneously address temporal and the spatial effects of transient fault. However, none of these approaches consider the omnidirectional spatial propagation of transient fault. Furthermore, these approaches have failed to consider the impact of transient fault on switching elements. This calls for methodology to tackle both the temporal and omnidirectional spatial effects of the transient fault on DSP cores. The proposed approach tackles these issues and presents a novel methodology to generate a low-cost fault-tolerant DSP core datapath against temporal (kc-cycle) and omnidirectional spatial (km-unit) impacts of SET. © 2003-2010 IEEE Canada.en_US
dc.language.isoenen_US
dc.publisherIEEE Canadaen_US
dc.sourceCanadian Journal of Electrical and Computer Engineeringen_US
dc.subjectFault toleranceen_US
dc.subjectRadiation hardeningen_US
dc.subjectTransientsen_US
dc.subjectMulti-cycleen_US
dc.subjectmultiuniten_US
dc.subjectomnidirectionalen_US
dc.subjectSingle event transientsen_US
dc.subjectSpatial impactsen_US
dc.subjectTransient faultsen_US
dc.subjectDigital signal processingen_US
dc.titleFault-Tolerant DSP Core Datapath Against Omnidirectional Spatial Impact of SETen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Computer Science and Engineering

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