Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5187
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dc.contributor.authorSingh, Vipulen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:38:54Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:38:54Z-
dc.date.issued2019-
dc.identifier.citationBhargava, K., & Singh, V. (2019). Spectroscopic characterization of Metal–Polymer interface for electronic applications. Paper presented at the Springer Proceedings in Physics, , 236 125-131. doi:10.1007/978-981-15-0202-6_10en_US
dc.identifier.isbn9789811502019-
dc.identifier.issn0930-8989-
dc.identifier.otherEID(2-s2.0-85076170277)-
dc.identifier.urihttps://doi.org/10.1007/978-981-15-0202-6_10-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/5187-
dc.description.abstractThe interfacial crystallinity of polymer semiconductors is critical toward fabricating the high-performance organic electronic devices like organic field-effect transistors wherein the majority of charge injection and collection occurs near the narrow metal–polymer interface. The two popular configurations of solution-processed organic transistors, viz., top contact and bottom contact involve metal–polymer interfaces with opposite sequence of deposition of metal electrode and polymer semiconductor. In this article, the crystallinity degradations of polymer films near the interfaces with electrodes in the two configurations have been described using some conventional spectroscopy techniques such as absorption, photoluminescence, and Raman spectroscopy techniques. It is observed and validated that crystallinity of solution-processed polymer film becomes severely degraded when metal electrode is coated over polymer film (top contact), in comparison to when polymer is coated over metal electrode (bottom contact) leading to the formation carrier injection barrier near the interface. © 2019, Springer Nature Singapore Pte Ltd.en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.sourceSpringer Proceedings in Physicsen_US
dc.subjectAbsorptionen_US
dc.subjectConducting polymersen_US
dc.subjectCrystallinityen_US
dc.subjectElectrodesen_US
dc.subjectInterfaces (materials)en_US
dc.subjectMetalsen_US
dc.subjectMoleculesen_US
dc.subjectOrganic field effect transistorsen_US
dc.subjectPhotoluminescenceen_US
dc.subjectPlastic coatingsen_US
dc.subjectSemiconducting filmsen_US
dc.subjectTransistorsen_US
dc.subjectConventional spectroscopyen_US
dc.subjectCrystallinity degradationen_US
dc.subjectElectronic applicationen_US
dc.subjectOrganic electronic devicesen_US
dc.subjectPolymer semiconductorsen_US
dc.subjectRamanen_US
dc.subjectSolution processed polymersen_US
dc.subjectSpectroscopic characterizationen_US
dc.subjectPolymer filmsen_US
dc.titleSpectroscopic Characterization of Metal–Polymer Interface for Electronic Applicationsen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Electrical Engineering

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