Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5221
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dc.contributor.authorChatterjee, Amiten_US
dc.contributor.authorDhanotia, Jitendraen_US
dc.contributor.authorBhatia, Vimalen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:39:01Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:39:01Z-
dc.date.issued2018-
dc.identifier.citationChatterjee, A., Dhanotia, J., Bhatia, V., Rana, S., & Prakash, S. (2018). Comparative analysis of single and multistep interferogram processing techniques. Paper presented at the 2017 14th IEEE India Council International Conference, INDICON 2017, doi:10.1109/INDICON.2017.8487516en_US
dc.identifier.isbn9781538643181-
dc.identifier.otherEID(2-s2.0-85056421149)-
dc.identifier.urihttps://doi.org/10.1109/INDICON.2017.8487516-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/5221-
dc.description.abstractDigital processing of optical interferograms have been used for wide range of applications in engineering and scientific research. Some of the applications include measurement of step height, tilt angle, micro-displacement, deformation, etc. Two main interferogram processing techniques are phase shifting (PS) and Fourier Transform method (FTM). PS technique has been used to demodulate the phase information from multiple phase shifted interferograms; whereas FT is used to extract phase information from a single interferogram. In this paper, we perform a comparative analysis of PS and FTM technique using simulation analysis. The techniques are assessed based on two common problems, i.e. noise and non-sinusoidal waveforms (harmonics) that arise in the measurement system and reduce the accuracy. A new multi-step imaging technique is proposed by combining the advantages of PS and FTM and is also compared based on the same parameters. Advantages and drawbacks of each technique are also discussed. © 2017 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.source2017 14th IEEE India Council International Conference, INDICON 2017en_US
dc.subjectFourier transformsen_US
dc.subjectImage processingen_US
dc.subjectOptical data processingen_US
dc.subjectFourier transform methoden_US
dc.subjectInterferogram analysisen_US
dc.subjectInterferogram processingen_US
dc.subjectNon-sinusoidal waveformsen_US
dc.subjectOptical interferogramsen_US
dc.subjectPhase extractionen_US
dc.subjectPhase-shiftingen_US
dc.subjectScientific researchesen_US
dc.subjectInterferometryen_US
dc.titleComparative Analysis of Single and Multistep Interferogram Processing Techniquesen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Electrical Engineering

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