Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5313
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dc.contributor.authorSingh, Pooranen_US
dc.contributor.authorVishvakarma, Santosh Kumaren_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:41:30Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:41:30Z-
dc.date.issued2017-
dc.identifier.citationReniwal, B. S., Singh, P., Vijayvargiya, V., & Vishvakarma, S. K. (2017). A new sense amplifier design with improved input referred offset characteristics for energy-efficient SRAM. Paper presented at the Proceedings - 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems, VLSID 2017, 335-340. doi:10.1109/VLSID.2017.54en_US
dc.identifier.isbn9781509057405-
dc.identifier.otherEID(2-s2.0-85018343506)-
dc.identifier.urihttps://doi.org/10.1109/VLSID.2017.54-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/5313-
dc.description.abstractFor SRAM sense amplifiers (SAs), higher offset voltages lead to an increased likelihood of an incorrect decision. Because differential SA is vulnerable to the bias current offset in the differential legs. Thus, SRAM suffer from slow read speed or low read yield. This paper for the first time presents a novel differential-current-compensation based SA (DCC-SA) to suppress the effect of offset due to device mismatch on SA differential current. The proposed scheme is rigorously analyzed and compared to the conventional schemes. The proposed technique, enable DCC-SA to achieve 0.66× and 0.86× tighter offset distribution than conventional current latch SA (CLSA) and SA with offset compensation (SAOC) respectively, under similar cell current and bitline capacitance. We design a CMOS-logic-compatible, 65 nm, 4 Kb SRAM macro, using the DCC-SA. This technique possesses up to 31%, 55%, 35% and 69% lower energy/access and 0.58×,-1.27×, 0.53× and 0.41× lower resolution time (RT), compared to CLSA, SAOC, Schmitt Trigger (ST) based SA (STn-SA), and stacked SA (STk-SA) respectively at worst case process corners. Further, the standard deviation (σ) of delay for DCC-SA is reduced to 0.3× and 0.56×, 0.3× and 0.54× as that of CLSA, SAOC, STn-SA and STk-SA respectively. © 2016 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceProceedings - 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems, VLSID 2017en_US
dc.subjectCapacitanceen_US
dc.subjectDynamic random access storageen_US
dc.subjectEmbedded systemsen_US
dc.subjectEnergy efficiencyen_US
dc.subjectIntegrated circuit designen_US
dc.subjectStatic random access storageen_US
dc.subjectVLSI circuitsen_US
dc.subjectConventional currentsen_US
dc.subjectConventional schemesen_US
dc.subjectDifferential currenten_US
dc.subjectinter die variationsen_US
dc.subjectintra die variationsen_US
dc.subjectLatch sense amplifiersen_US
dc.subjectOffseten_US
dc.subjectOffset compensationen_US
dc.subjectAmplifiers (electronic)en_US
dc.titleA New Sense Amplifier Design with Improved Input Referred Offset Characteristics for Energy-Efficient SRAMen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Electrical Engineering

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