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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Dhanotia, Jitendra | en_US |
dc.contributor.author | Bhatia, Vimal | en_US |
dc.date.accessioned | 2022-03-17T01:00:00Z | - |
dc.date.accessioned | 2022-03-17T15:41:33Z | - |
dc.date.available | 2022-03-17T01:00:00Z | - |
dc.date.available | 2022-03-17T15:41:33Z | - |
dc.date.issued | 2017 | - |
dc.identifier.citation | Dhanotia, J., Bopche, L., Bhatia, V., & Prakash, S. (2017). Fingerprint detection and analysis using talbot interferometry. Paper presented at the Springer Proceedings in Physics, , 194 263-269. doi:10.1007/978-981-10-3908-9_32 | en_US |
dc.identifier.isbn | 9789811039072 | - |
dc.identifier.issn | 0930-8989 | - |
dc.identifier.other | EID(2-s2.0-85030672072) | - |
dc.identifier.uri | https://doi.org/10.1007/978-981-10-3908-9_32 | - |
dc.identifier.uri | https://dspace.iiti.ac.in/handle/123456789/5325 | - |
dc.description.abstract | In the present communication, a full field technique for mapping latent fingerprint using Talbot interferometry has been proposed. Collimated light from He–Ne laser illuminates a specimen comprising of a fingerprint implanted onto a reflecting surface. Reflected light carries information regarding the depth and orientation of furrows and ridges in the fingerprint. The topological information of the fingerprint is retrieved using phase shifting interferometric technique. The slope of the phase provides the information regarding variation in ridges of latent fingerprint. The proposed technique does not require any kind of chemical or physical treatment. © Springer Nature Singapore Pte Ltd. 2017. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Springer Science and Business Media, LLC | en_US |
dc.source | Springer Proceedings in Physics | en_US |
dc.subject | Interferometry | en_US |
dc.subject | Light | en_US |
dc.subject | Collimated light | en_US |
dc.subject | Fingerprint detections | en_US |
dc.subject | Interferometric techniques | en_US |
dc.subject | Latent fingerprint | en_US |
dc.subject | Physical treatments | en_US |
dc.subject | Reflecting surface | en_US |
dc.subject | Talbot interferometry | en_US |
dc.subject | Topological information | en_US |
dc.subject | Pattern recognition | en_US |
dc.title | Fingerprint detection and analysis using talbot interferometry | en_US |
dc.type | Conference Paper | en_US |
Appears in Collections: | Department of Electrical Engineering |
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