Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5539
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dc.contributor.authorMukherjee, Shaibalen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:42:28Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:42:28Z-
dc.date.issued2021-
dc.identifier.citationKokh, K. A., Atuchin, V. V., Adichtchev, S. V., Gavrilova, T. A., Bakhadur, A. M., Klimov, A. O., . . . Surovtsev, N. V. (2021). Cu2ZnSnS4crystal growth using an SnCl2based flux. CrystEngComm, 23(4), 1025-1032. doi:10.1039/d0ce01264een_US
dc.identifier.issn1466-8033-
dc.identifier.otherEID(2-s2.0-85100278135)-
dc.identifier.urihttps://doi.org/10.1039/d0ce01264e-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/5539-
dc.description.abstractThe stoichiometry and phase homogeneity of the kesterite type compound Cu2ZnSnS4play a key role in its efficiency in solar cells. In this work, CuCl2, ZnCl2and SnCl2were applied as solvents in the Cu2ZnSnS4crystal growth for the first time. The multiphase ingot was obtained by direct fusion of the stoichiometric batch composed of constituent elements. Compared to that, the material recrystallized in SnCl2presented a single-phase Zn-rich kesterite with composition Cu1.94Zn1.06SnS4and unit cell parameters ofa= 5.4324(3) andc= 10.8383(2) Å. The crystal structure of Cu1.94Zn1.06SnS4was determined by single crystal X-ray diffraction analysis. The integral phase purity of the crystals grown with the use of the SnCl2solvent was verified by powder X-ray diffraction analysis and Raman measurements. In the Raman spectrum, the FWHM value of the 337 cm−1line was as low as 9.6 cm−1that indicates the minimal lattice disorder. © The Royal Society of Chemistry 2021.en_US
dc.language.isoenen_US
dc.publisherRoyal Society of Chemistryen_US
dc.sourceCrystEngCommen_US
dc.subjectCopper compoundsen_US
dc.subjectSingle crystalsen_US
dc.subjectX ray powder diffractionen_US
dc.subjectConstituent elementsen_US
dc.subjectIts efficienciesen_US
dc.subjectLattice disordersen_US
dc.subjectPhase homogeneityen_US
dc.subjectPowder X ray diffractionen_US
dc.subjectRaman measurementsen_US
dc.subjectSingle crystal X-ray diffraction analysisen_US
dc.subjectUnit cell parametersen_US
dc.subjectCrystal structureen_US
dc.titleCu2ZnSnS4crystal growth using an SnCl2based fluxen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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