Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5786
Title: Raised Body Doping-Less 1T-DRAM with Source/Drain Schottky Contact
Authors: Navlakha, Nupur
Kranti, Abhinav
Keywords: Thermionic emission;1t drams;Capacitor-less;Electrons and holes;Programming window;raised body;Random dopant fluctuation;Schottky source/drain;Source/drain regions;C (programming language)
Issue Date: 2019
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Lin, J. -., Sun, W. -., Lin, H. -., Chen, Y. -., Navlakha, N., & Kranti, A. (2019). Raised body doping-less 1T-DRAM with Source/Drain schottky contact. IEEE Journal of the Electron Devices Society, 7, 282-286. doi:10.1109/JEDS.2019.2896412
Abstract: In this paper, we propose a novel structure of doping-less 1T-DRAM with raised body and Schottky contact to source/drain regions which uses thermionic emission to generate electrons and holes. As the device is free from physical doping, the problems associated with random dopant fluctuations will be eliminated in the proposed doping-less topology. Our simulation results show that a programming window of 28.7 μ A μ m at a gate length of 10 nm with the retention time of 466 ms at 27 °C and 79 ms at 85 °C can be achieved with the proposed doping-less 1T-DRAM, which is much better than a conventional charge-plasma based doping-less 1T DRAM. © 2013 IEEE.
URI: https://doi.org/10.1109/JEDS.2019.2896412
https://dspace.iiti.ac.in/handle/123456789/5786
ISSN: 2168-6734
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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