Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5804
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dc.contributor.authorMukherjee, Shaibalen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:44:02Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:44:02Z-
dc.date.issued2018-
dc.identifier.citationGarg, V., Sengar, B. S., Sharma, P., Kumar, A., Aaryashree, Kumar, S., & Mukherjee, S. (2018). Sputter-instigated plasmon-enhanced optical backscattering layer in ultrathin solar cells: Application of GZO in CIGSe material system. Solar Energy, 174, 35-44. doi:10.1016/j.solener.2018.08.074en_US
dc.identifier.issn0038-092X-
dc.identifier.otherEID(2-s2.0-85052740372)-
dc.identifier.urihttps://doi.org/10.1016/j.solener.2018.08.074-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/5804-
dc.description.abstractRecently, realization of ultrathin solar cells is the area of interest of researchers in the domain of cost-effective photovoltaics. This study demonstrates a novel way of generation of plasmonic features in transparent conducting oxide material in the form of Ga-doped ZnO (GZO) thin films to compensate for the loss of optical absorption due to reduced absorber thickness. Through an extensive analysis of photoelectron spectroscopy, spectroscopic ellipsometry, and field emission scanning electron microscope measurements the evaluation of plasmonic features and correlation of them with various metallic and metal-oxide nanoclusters inside GZO thin film and GZO/CIGSe heterojunction interface are carried out. Moreover, we have thoroughly analyzed the applicability of GZO plasmon enhanced thin film as a backscattering layer based on (a) verification of plasmonic behavior in GZO film (∼150 nm), (b) checking on the sustainability of such plasmonic behavior in ultrathin GZO (∼5 nm) layer, (c) investigation of plasmonic feature at the heterojunction, (d) band offset studies at the plasmon-enhanced-GZO/CIGSe heterojunction, and (e) investigating the electrical performance of the junction to verify the linear behavior and resistivity calculation of the heterojunction. © 2018en_US
dc.language.isoenen_US
dc.publisherElsevier Ltden_US
dc.sourceSolar Energyen_US
dc.subjectBackscatteringen_US
dc.subjectCost effectivenessen_US
dc.subjectGallium compoundsen_US
dc.subjectHeterojunctionsen_US
dc.subjectII-VI semiconductorsen_US
dc.subjectLight absorptionen_US
dc.subjectMetalsen_US
dc.subjectNanostructured materialsen_US
dc.subjectOxide mineralsen_US
dc.subjectPhotoelectron spectroscopyen_US
dc.subjectPlasmonicsen_US
dc.subjectScanning electron microscopyen_US
dc.subjectSolar cellsen_US
dc.subjectSolar power generationen_US
dc.subjectSpectroscopic analysisen_US
dc.subjectSpectroscopic ellipsometryen_US
dc.subjectTransparent conducting oxidesen_US
dc.subjectX ray photoelectron spectroscopyen_US
dc.subjectZinc oxideen_US
dc.subjectBand offsetsen_US
dc.subjectCIGSeen_US
dc.subjectDIBSen_US
dc.subjectElectrical performanceen_US
dc.subjectField emission scanning electron microscopesen_US
dc.subjectHeterojunction interfacesen_US
dc.subjectOptical backscatteringen_US
dc.subjectUltra-thinen_US
dc.subjectThin filmsen_US
dc.subjectabsorptionen_US
dc.subjectbackscatteren_US
dc.subjectelectronen_US
dc.subjectfilmen_US
dc.subjectoxideen_US
dc.subjectphotovoltaic systemen_US
dc.subjectsolar poweren_US
dc.subjectX-ray spectroscopyen_US
dc.titleSputter-instigated plasmon-enhanced optical backscattering layer in ultrathin solar cells: Application of GZO in CIGSe material systemen_US
dc.typeJournal Articleen_US
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