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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Singh, Pooran | en_US |
dc.contributor.author | Sharma, Vishal | en_US |
dc.contributor.author | Vishvakarma, Santosh Kumar | en_US |
dc.date.accessioned | 2022-03-17T01:00:00Z | - |
dc.date.accessioned | 2022-03-17T15:44:16Z | - |
dc.date.available | 2022-03-17T01:00:00Z | - |
dc.date.available | 2022-03-17T15:44:16Z | - |
dc.date.issued | 2018 | - |
dc.identifier.citation | Singh, P., Reniwal, B. S., Vijayvargiya, V., Sharma, V., & Vishvakarma, S. K. (2018). Ultra low power-high stability, positive feedback controlled (PFC) 10T SRAM cell for look up table (LUT) design. Integration, 62, 1-13. doi:10.1016/j.vlsi.2018.03.006 | en_US |
dc.identifier.issn | 0167-9260 | - |
dc.identifier.other | EID(2-s2.0-85044729223) | - |
dc.identifier.uri | https://doi.org/10.1016/j.vlsi.2018.03.006 | - |
dc.identifier.uri | https://dspace.iiti.ac.in/handle/123456789/5840 | - |
dc.description.abstract | To improve leakage power along with better cell stability, a 10 T SRAM cell is presented in this paper. Further, the proposed cell is used to implement a 6-input look up table (LUT) of FPGA and a 2 kb SRAM macroblock. The proposed cell achieves better results in terms of write static noise margin by 1.66 ×, 1.8 ×; read static noise margin by 3.8 ×, 1.37 ×; write trip point by 2 ×, 2 × as compared to conventional (C) 6 T, read decoupled (RD) 8 T SRAM, respectively. The leakage power is also reduced to 0.07 ×, and 0.43 × as compared C6T and RD8T SRAM, respectively at 0.3 V VDD. © 2018 | en_US |
dc.language.iso | en | en_US |
dc.publisher | Elsevier B.V. | en_US |
dc.source | Integration | en_US |
dc.subject | Cells | en_US |
dc.subject | Cytology | en_US |
dc.subject | Electric power factor correction | en_US |
dc.subject | Field programmable gate arrays (FPGA) | en_US |
dc.subject | Integrated circuit design | en_US |
dc.subject | Static random access storage | en_US |
dc.subject | Table lookup | en_US |
dc.subject | Cell stability | en_US |
dc.subject | Leakage power | en_US |
dc.subject | Look up table | en_US |
dc.subject | Macro block | en_US |
dc.subject | SRAM Cell | en_US |
dc.subject | Static noise margin | en_US |
dc.subject | Ultra low power | en_US |
dc.subject | Feedback | en_US |
dc.title | Ultra low power-high stability, positive feedback controlled (PFC) 10T SRAM cell for look up table (LUT) design | en_US |
dc.type | Journal Article | en_US |
Appears in Collections: | Department of Electrical Engineering |
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