Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5946
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dc.contributor.authorDhanotia, Jitendraen_US
dc.contributor.authorDisawal, Reenaen_US
dc.contributor.authorBhatia, Vimalen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:45:02Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:45:02Z-
dc.date.issued2017-
dc.identifier.citationDhanotia, J., Disawal, R., Bhatia, V., & Prakash, S. (2017). Improved accuracy in slope measurement and defect detection using fourier fringe analysis. Optik, 140, 921-930. doi:10.1016/j.ijleo.2017.05.023en_US
dc.identifier.issn0030-4026-
dc.identifier.otherEID(2-s2.0-85019238557)-
dc.identifier.urihttps://doi.org/10.1016/j.ijleo.2017.05.023-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/5946-
dc.description.abstractThis communication reports investigation undertaken towards measurement of slope and defect detection of bent plates (rectangular and circular) using moiré deflectometry in conjunction with Fourier transform technique. For slope mapping, specimen is illuminated by collimated light from a laser. The back reflected light from the front surface of the specimen is incident on a set of two gratings placed in tandem, resulting in the formation of laterally sheared interferograms. The interferograms are recorded using a CCD (charge coupled device) camera. Direct phase measurement using Fourier transform method has been used for measurement of slope and detection of defects. The experimental setup is simple and the slope measurement and detection of defects are undertaken successfully in each case. Experimental results conclusively establish the viability of the technique. Good accuracy and precision in measurement have been achieved. © 2017 Elsevier GmbHen_US
dc.language.isoenen_US
dc.publisherElsevier GmbHen_US
dc.sourceOptiken_US
dc.subjectCharge coupled devicesen_US
dc.subjectDefectsen_US
dc.subjectFourier transformsen_US
dc.subjectInterferometryen_US
dc.subjectMeasurementsen_US
dc.subjectAccuracy and precisionen_US
dc.subjectDefect detectionen_US
dc.subjectDetection of defectsen_US
dc.subjectDirect phase measurementen_US
dc.subjectFourier fringe analysisen_US
dc.subjectFourier transform methoden_US
dc.subjectPhase detectionen_US
dc.subjectSlope measurementen_US
dc.subjectPhase measurementen_US
dc.titleImproved accuracy in slope measurement and defect detection using Fourier fringe analysisen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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