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Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5969
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dc.contributor.authorAwasthi, Vishnu Kumaren_US
dc.contributor.authorMukherjee, Shaibalen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:45:14Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:45:14Z-
dc.date.issued2017-
dc.identifier.citationAwasthi, V., Garg, V., Sengar, B. S., Pandey, S. K., Aaryashree, Kumar, S., . . . Mukherjee, S. (2017). Impact of sputter-instigated plasmonic features in TCO films: For ultrathin photovoltaic applications. Applied Physics Letters, 110(10) doi:10.1063/1.4978269en_US
dc.identifier.issn0003-6951-
dc.identifier.otherEID(2-s2.0-85014904489)-
dc.identifier.urihttps://doi.org/10.1063/1.4978269-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/5969-
dc.description.abstractThe structural and optical properties of Ga-doped ZnO (GZO) and Ga-doped MgZnO (GMZO) individual films are analyzed. Sputter-instigated plasmonic features are observed in individual GZO and GMZO films due to the formation of metal and metal oxide nanoclusters. The plasmon generation is verified by electron energy loss spectra obtained by ultraviolet-photoelectron spectroscopy, spectroscopic ellipsometry, and field-emission scanning-electron microscopy measurements. This is promising in terms of increasing the efficiency of the solar cell by increasing the optical path length in the absorbing layer while keeping the same physical length by light scattering and trapping mechanism. © 2017 Author(s).en_US
dc.language.isoenen_US
dc.publisherAmerican Institute of Physics Inc.en_US
dc.sourceApplied Physics Lettersen_US
dc.subjectElectron energy levelsen_US
dc.subjectElectron energy loss spectroscopyen_US
dc.subjectEnergy dissipationen_US
dc.subjectField emission microscopesen_US
dc.subjectGalliumen_US
dc.subjectLight scatteringen_US
dc.subjectMetalsen_US
dc.subjectOptical propertiesen_US
dc.subjectOxide filmsen_US
dc.subjectPhotoelectron spectroscopyen_US
dc.subjectPlasmonsen_US
dc.subjectScanning electron microscopyen_US
dc.subjectSolar cellsen_US
dc.subjectSpectroscopic ellipsometryen_US
dc.subjectUltraviolet photoelectron spectroscopyen_US
dc.subjectElectron energy loss spectrumen_US
dc.subjectField emission scanning electron microscopyen_US
dc.subjectGadoped ZnO (GZO)en_US
dc.subjectOptical path lengthsen_US
dc.subjectPhotovoltaic applicationsen_US
dc.subjectPlasmon generationen_US
dc.subjectStructural and optical propertiesen_US
dc.subjectTrapping mechanismsen_US
dc.subjectUltrathin filmsen_US
dc.titleImpact of sputter-instigated plasmonic features in TCO films: For ultrathin photovoltaic applicationsen_US
dc.typeJournal Articleen_US
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