Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/6137
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dc.contributor.authorVishvakarma, Santosh Kumaren_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:46:36Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:46:36Z-
dc.date.issued2013-
dc.identifier.citationSharma, D., & Vishvakarma, S. K. (2013). Precise analytical model for short-channel quadruple-gate gate-all-around MOSFET. IEEE Transactions on Nanotechnology, 12(3), 378-385. doi:10.1109/TNANO.2013.2251895en_US
dc.identifier.issn1536-125X-
dc.identifier.otherEID(2-s2.0-84877867487)-
dc.identifier.urihttps://doi.org/10.1109/TNANO.2013.2251895-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/6137-
dc.description.abstractA compact analytical model is presented for crossover point, subthreshold slope, virtual cathode position, and threshold voltage for a short-channel quadruple-gate (QuaG) gate-all-around (GAA) MOSFET. The potential distribution in the channel is obtained by an analytical solution of 3-D Poisson's equation, where the electron quasi-Fermi level is approximated to be zero for low drain-to-source voltages. Using isomorphic polynomial function for potential distribution, we have analyzed, for the first time, the crossover point for the QuaG GAA MOSFET. Further, the modeled subthreshold slope for lightly doped QuaG GAA MOSFET has been improved by introducing \it z-dependent characteristic length, and the position of minimum center potential in the channel is obtained by virtual cathode position. A model is proposed for threshold voltage, based on shifting of the inversion charge from center line to silicon-insulator interface. © 2002-2012 IEEE.en_US
dc.language.isoenen_US
dc.sourceIEEE Transactions on Nanotechnologyen_US
dc.subjectCharacteristic lengthen_US
dc.subjectCrossover pointsen_US
dc.subjectDrain-to-source voltagesen_US
dc.subjectGate-all-around MOSFETen_US
dc.subjectPolynomial functionsen_US
dc.subjectPotential distributionsen_US
dc.subjectSubthreshold slopeen_US
dc.subjectVirtual cathodesen_US
dc.subjectAnalytical modelsen_US
dc.subjectCathodesen_US
dc.subjectGallium alloysen_US
dc.subjectModelsen_US
dc.subjectPoisson equationen_US
dc.subjectThreshold voltageen_US
dc.subjectMOSFET devicesen_US
dc.titlePrecise analytical model for short-channel quadruple-gate gate-all-around MOSFETen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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