Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/7712
Title: Structural optoelectronic and morphological investigation in Cu1-xSixO (x≤0<0.0468)
Authors: Paul, Ananta
Mishra, Prashant Kumar
Amin, Ruhul
Kissinquinker, Bungkiu
Sen, Somaditya
Issue Date: 2020
Publisher: American Institute of Physics Inc.
Citation: Paul, A., Ganesh, S., Mishra, P. K., Amin, R., Kissinquinker, B., & Sen, S. (2020). Structural optoelectronic and morphological investigation in Cu1-xSixO (x≤0<0.0468). Paper presented at the AIP Conference Proceedings, , 2265 doi:10.1063/5.0017495
Abstract: Si plays an important role in improving the conductive behavior of most oxides. Si+4 in place of Cu2+ in CuO have a tendency of attracting more oxygen in the lattice. By doping ~4% Si in CuO the indirect bandgap is observed to be modified from 1.49 eV to 1.45 eV. Raman and XRD studies detail the structural properties and reveal no extra phase in the solid solutions. The conductivity increased by three orders in the Si doped samples. FESEM studies reveal a change of morphology with Si doping from spherical to nanorod-like formation. © 2020 American Institute of Physics Inc.. All rights reserved.
URI: https://doi.org/10.1063/5.0017495
https://dspace.iiti.ac.in/handle/123456789/7712
ISBN: 9.78074E+12
ISSN: 0094-243X
Type of Material: Conference Paper
Appears in Collections:Department of Physics

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: