Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/7738
Full metadata record
DC FieldValueLanguage
dc.contributor.authorTiwari, Saurabhen_US
dc.contributor.authorSen, Somadityaen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-21T11:13:52Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-21T11:13:52Z-
dc.date.issued2018-
dc.identifier.citationTiwari, S., Balasubramanian, N., Biring, S., & Sen, S. (2018). Effect of co doping on structural and mechanical properties of CeO2. Paper presented at the AIP Conference Proceedings, , 1966 doi:10.1063/1.5038716en_US
dc.identifier.isbn9.78074E+12-
dc.identifier.issn0094-243X-
dc.identifier.otherEID(2-s2.0-85047826707)-
dc.identifier.urihttps://doi.org/10.1063/1.5038716-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/7738-
dc.description.abstractSol-gel synthesized nanocrystalline Co doped CeO2 powders [(Ce1-xCoxO2; x=0, 0.03)] were made into cylindrical discs by uniaxial pressing and sintered at 1500°C for 24h to measure mechanical properties. The pure phase formation of undoped and Co doped samples were confirmed by X-ray diffraction and Raman analysis. The scanning electron microscopy (SEM) was used for observing the microstructure of sintered samples to investigate density, porosity, and grain size. The grains size observed for 1500°C sintered samples 5-8 μm. Vickers indentation method used for investigating the micro-hardness. For undoped CeO2 micro-hardness was found 6.2 GPa which decreased with Co doping. It was found that samples follow indentation size effect (ISE) and follow elastic than plastic deformation. Enhanced ductile nature with Co doping in CeO2 made it more promising material for optoelectronic device applications. © 2018 Author(s).en_US
dc.language.isoenen_US
dc.publisherAmerican Institute of Physics Inc.en_US
dc.sourceAIP Conference Proceedingsen_US
dc.titleEffect of Co doping on structural and mechanical properties of CeO2en_US
dc.typeConference Paperen_US
Appears in Collections:Department of Physics

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: