Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/7773
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dc.contributor.authorRai, Hari Mohanen_US
dc.contributor.authorSagdeo, Pankaj R.en_US
dc.contributor.authorKumar, Rajeshen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-21T11:13:56Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-21T11:13:56Z-
dc.date.issued2015-
dc.identifier.citationSaxena, S. K., Rai, H. M., Late, R., Sagdeo, P. R., & Kumar, R. (2015). Origin of photoluminescence from silicon nanowires prepared by metal induced etching (MIE). Paper presented at the AIP Conference Proceedings, , 1661 doi:10.1063/1.4915418en_US
dc.identifier.isbn9.78074E+12-
dc.identifier.issn0094-243X-
dc.identifier.otherEID(2-s2.0-85006226081)-
dc.identifier.urihttps://doi.org/10.1063/1.4915418-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/7773-
dc.description.abstractIn this present study the origin of luminescence from silicon nanowires (SiNws) has been studied. SiNWs are fabricated on Si substrate by metal induced chemical etching (MIE). Here it is found that the band gap of SiNWs is higher than the gap of luminescent states in SiNWs which leads to the effect of Si=O bond. The band gap is estimated from diffuse reflectance analysis. Here we observe that band gap can be tailored depending on size (quantum confinement) but photoluminescence (PL) from all the sample is found to be fixed at 1.91 eV. This study is important for the understanding of origin of photoluminescence. © 2015 AIP Publishing LLC.en_US
dc.language.isoenen_US
dc.publisherAmerican Institute of Physics Inc.en_US
dc.sourceAIP Conference Proceedingsen_US
dc.titleOrigin of photoluminescence from Silicon nanowires prepared by Metal Induced Etching (MIE)en_US
dc.typeConference Paperen_US
Appears in Collections:Department of Physics

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