Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/8028
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dc.contributor.authorChaudhary, Anjalien_US
dc.contributor.authorPathak, Devesh Kumaren_US
dc.contributor.authorTanwar, Manushreeen_US
dc.contributor.authorKumar, Rajeshen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-21T11:14:46Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-21T11:14:46Z-
dc.date.issued2020-
dc.identifier.citationChaudhary, A., Pathak, D. K., Tanwar, M., & Kumar, R. (2020). Tracking dynamic doping in a solid-state electrochromic device: Raman microscopy validates the switching mechanism. Analytical Chemistry, 92(8), 6088-6093. doi:10.1021/acs.analchem.0c00513en_US
dc.identifier.issn0003-2700-
dc.identifier.otherEID(2-s2.0-85082828576)-
dc.identifier.urihttps://doi.org/10.1021/acs.analchem.0c00513-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/8028-
dc.description.abstractSolid-state electrochromic devices often need appropriate characterization to establish the real working mechanism for optimization and diagnosis. Raman mapping has been used here to track "dynamic doping", an important concept in organic electronics and in polythiophene-based solid-state electrochromic devices to understand and validate the mechanism of bias-induced redox-driven color switching. The proposed method demonstrates the live formation and movement of polarons which is best suited for in situ solid-state Raman spectroelectrochemistry. A 2-fold approach has been adopted here for this (1) by fabricating a working device in cross bar geometry followed by in situ spectroscopy to demonstrate the device functioning and (2) by carrying out Raman mapping from a device in custom-designed thin-film-transistor-like geometry to track and actually "see" the mechanism spectroscopically. © 2020 American Chemical Society.en_US
dc.language.isoenen_US
dc.publisherAmerican Chemical Societyen_US
dc.sourceAnalytical Chemistryen_US
dc.subjectElectrochromic devicesen_US
dc.subjectElectrochromismen_US
dc.subjectMappingen_US
dc.subjectSemiconductor dopingen_US
dc.subjectSpectroelectrochemistryen_US
dc.subjectThin film transistorsen_US
dc.subjectDevice functioningen_US
dc.subjectIn-situ spectroscopyen_US
dc.subjectOrganic electronicsen_US
dc.subjectRaman microscopyen_US
dc.subjectRaman spectroelectrochemistryen_US
dc.subjectSolid state electrochromic devicesen_US
dc.subjectSwitching mechanismen_US
dc.subjectWorking mechanismsen_US
dc.subjectDynamicsen_US
dc.titleTracking Dynamic Doping in a Solid-State Electrochromic Device: Raman Microscopy Validates the Switching Mechanismen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Physics

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