Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/8278
Title: Exciplex-Forming Cohost for High Efficiency and High Stability Phosphorescent Organic Light-Emitting Diodes
Authors: Sen, Somaditya
Keywords: Electroluminescence;Electronic equipment;Energy dissipation;Energy transfer;Fluorescence;Iridium;Light emission;Phosphorescence;Photodegradation;electroluminescent lifetime;Electron transporting materials;Exciplexes;External quantum efficiency;Hole-transporting materials;Phosphorescent organic light emitting diodes;Photoinduced degradation;Thermally activated delayed fluorescences;Organic light emitting diodes (OLED)
Issue Date: 2018
Publisher: American Chemical Society
Citation: Shih, C. -., Lee, C. -., Chen, Y. -., Biring, S., Kumar, G., Yeh, T. -., . . . Wong, K. -. (2018). Exciplex-forming cohost for high efficiency and high stability phosphorescent organic light-emitting diodes. ACS Applied Materials and Interfaces, 10(2), 2151-2157. doi:10.1021/acsami.7b15034
Abstract: An exciplex forming cohost system is employed to achieve a highly efficient organic light-emitting diode (OLED) with good electroluminescent lifetime. The exciplex is formed at the interfacial contact of a conventional star-shaped carbazole hole-transporting material, 4,4′,4″-tris(N-carbazolyl)-triphenylamine (TCTA), and a triazine electron-transporting material, 2,4,6-tris[3-(1H-pyrazol-1-yl)phenyl]-1,3,5-triazine (3P-T2T). The excellent combination of TCTA and 3P-T2T is applied as the cohost of a common green phosphorescent emitter with almost zero energy loss. When Ir(ppy)2(acac) is dispersed in such exciplex cohost system, OLED device with maximum external quantum efficiency of 29.6%, the ultrahigh power efficiency of 147.3 lm/W, and current efficiency of 107 cd/A were successfully achieved. More importantly, the OLED device showed a low-efficiency roll-off and an operational lifetime (τ80) of ∼1020 min with the initial brightness of 2000 cd/m2, which is 56 times longer than the reference device. The significant difference of device stability was attributed to the degradation of exciplex system for energy transfer process, which was investigated by the photoluminescence aging measurement at room temperature and 100 K, respectively. © 2017 American Chemical Society.
URI: https://doi.org/10.1021/acsami.7b15034
https://dspace.iiti.ac.in/handle/123456789/8278
ISSN: 1944-8244
Type of Material: Journal Article
Appears in Collections:Department of Physics

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: