Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/8406
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dc.contributor.authorRai, Hari Mohanen_US
dc.contributor.authorKumar, Rajeshen_US
dc.contributor.authorSagdeo, Pankaj R.en_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-21T11:16:41Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-21T11:16:41Z-
dc.date.issued2016-
dc.identifier.citationLate, R., Rai, H. M., Saxena, S. K., Kumar, R., Sagdeo, A., & Sagdeo, P. R. (2016). Effect of hf doping on the structural, dielectric and optical properties of CaCu3Ti4O12 ceramic. Journal of Materials Science: Materials in Electronics, 27(6), 5878-5885. doi:10.1007/s10854-016-4505-6en_US
dc.identifier.issn0957-4522-
dc.identifier.otherEID(2-s2.0-84964928060)-
dc.identifier.urihttps://doi.org/10.1007/s10854-016-4505-6-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/8406-
dc.description.abstractCeramic samples of CaCu3(Ti1-xHfx)4O12(CCTHO) were prepared by solid state reaction method. The influences of Hf+4 ions substitution on the structural, optical and dielectric properties of the prepared samples were investigated using X-ray diffraction, diffuse reflectance spectroscopy and impedance spectroscopy respectively. The solubility limit of Hf in CaCu3Ti4O12 (CCTO) is found to be ~ 2%. The optical spectroscopy data reveals that with Hf doping the optical band gap increases. Further we observed that with Hf substitution in CCTO at Ti site improves the dielectric properties, i.e. the value of dielectric constant (ε´) increases and that of dielectric loss (tanδ) decreases with respect to parent un-doped CCTO sample. Two dielectric relaxations are observed in Hf doped sample, whereas only one relaxation is observed in CCTO. The characteristic dielectric relaxation frequency shifts towards higher values with Hf doping. Further from the fitting of ε´ versus frequency data it appears that the relaxation mechanism shifts from Debye to Cole–Cole type. © Springer Science+Business Media New York 2016.en_US
dc.language.isoenen_US
dc.publisherSpringer New York LLCen_US
dc.sourceJournal of Materials Science: Materials in Electronicsen_US
dc.subjectCeramic materialsen_US
dc.subjectDielectric lossesen_US
dc.subjectDielectric propertiesen_US
dc.subjectDielectric relaxationen_US
dc.subjectEnergy gapen_US
dc.subjectHafniumen_US
dc.subjectSolid state reactionsen_US
dc.subjectSpectroscopyen_US
dc.subjectX ray diffractionen_US
dc.subjectCharacteristic dielectric relaxationsen_US
dc.subjectDielectric and optical propertiesen_US
dc.subjectDiffuse reflectance spectroscopyen_US
dc.subjectImpedance spectroscopyen_US
dc.subjectOptical and dielectric propertiesen_US
dc.subjectOptical spectroscopyen_US
dc.subjectRelaxation mechanismen_US
dc.subjectSolid state reaction methoden_US
dc.subjectOptical propertiesen_US
dc.titleEffect of Hf doping on the structural, dielectric and optical properties of CaCu3Ti4O12 ceramicen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Physics

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