Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/9844
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dc.contributor.authorGhosh, Abhijiten_US
dc.date.accessioned2022-05-05T15:47:48Z-
dc.date.available2022-05-05T15:47:48Z-
dc.date.issued2022-
dc.identifier.citationLal, D., Tripathi, A., Ghosh, A., Bathe, R., Kumar, P., & Jayaram, V. (2022). Use of compression-bending fracture geometry to study the effects of stoichiometry on fracture toughness of β-NiAl doi:10.1007/978-981-16-8724-2_29 Retrieved from www.scopus.comen_US
dc.identifier.isbn978-9811687235-
dc.identifier.issn2195-4356-
dc.identifier.otherEID(2-s2.0-85127066850)-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/9844-
dc.identifier.urihttps://doi.org/10.1007/978-981-16-8724-2_29-
dc.description.abstractCompression-bending fracture geometry is a stable fracture geometry, which can enable the study of crack propagation and associated processes, such as crack bridging and microstructural and compositional inhomogeneity induced variation of fracture toughness and R-curve behavior. It was observed that surface friction strongly influences the fracture behavior of this geometry. The existing equation of Mode I stress intensity factor, KI, has been found to be accurate for the case of very low platen-sample surface friction and a narrow range of crack length. The fracture toughness of bulk polycrystalline β-NiAl of two compositions was measured using this geometry. The measured values of fracture toughness of Ni-50Al and Ni-40Al are 1.7 ± 0.6 and 4.3 ± 1 MPa m0.5, respectively. © 2022, The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.en_US
dc.language.isoenen_US
dc.publisherSpringer Science and Business Media Deutschland GmbHen_US
dc.sourceLecture Notes in Mechanical Engineeringen_US
dc.titleUse of Compression-Bending Fracture Geometry to Study the Effects of Stoichiometry on Fracture Toughness of β-NiAlen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Metallurgical Engineering and Materials Sciences

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