Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/9955
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dc.contributor.authorSingh Thakur, Puneeten_US
dc.contributor.authorTiwari, Bhavyaen_US
dc.contributor.authorKumar, Abhisheken_US
dc.contributor.authorGedam, Bhaveshen_US
dc.contributor.authorBhatia, Vimalen_US
dc.date.accessioned2022-05-05T15:54:57Z-
dc.date.available2022-05-05T15:54:57Z-
dc.date.issued2022-
dc.identifier.citationSingh, R., Bailung, Y., & Roy, A. (2022). Dynamics of particle production in pb-pb collisions at sNN =2.76 TeV using the PYTHIA8 angantyr model. Physical Review C, 105(3) doi:10.1103/PhysRevC.105.035202en_US
dc.identifier.issn0168-1699-
dc.identifier.otherEID(2-s2.0-85127225551)-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/9955-
dc.identifier.urihttps://doi.org/10.1016/j.compag.2022.106891-
dc.description.abstractSeed-quality is one of the most important factors for achieving the objectives of uniform seedling establishment and high crop yield. In this work, we propose laser backscattering and deep transfer learning (TL) based photonics sensor for automatic identification and classification of high-quality seeds. The proposed sensor is based on capturing a single backscattered image of a seed sample and processing the acquired images by using deep learning (DL) based algorithms. Advantages of the proposed sensor include its ability to characterize morphological and biological changes related to seed-quality, lower memory requirement, robustness against external noise and vibration, easy alignments, and low complexity of acquisition and processing units. Furthermore, use of DL based processing frameworks including convolution neural network (CNN) and various TL models (VGG16, VGG19, InceptionV3, and ResNet50) extract abstract features from the images without any additional image processing and accelerate classification efficiency. Obtained results indicate that all the DL models performed significantly well with higher accuracy; however, InceptionV3 outperformed rest of the models with accuracy reaching up to 98.31%. To validate performance of the proposed sensor standard quality parameters comprising percentage imbibition (PI), radicle length, and germination percentage (GP) were also calculated. Significant change (p < 0.05) in these parameters show that the proposed sensor can accurately monitor the quality of seeds with higher accuracy. Moreover, experimental simplicity and DL based automatic classification make the sensor suitable for real-time applications. © 2022 Elsevier B.V.en_US
dc.language.isoenen_US
dc.publisherElsevier B.V.en_US
dc.sourceComputers and Electronics in Agricultureen_US
dc.subjectAutomation|Convolution|Photonics|Seed|Automatic classification|Convolution neural network|Crop yield|Deep learning|High-accuracy|Learning models|Photonic sensors|Seed quality|Seedling establishment|Transfer learning|Deep learning|artificial neural network|assessment method|complexity|germination|image processing|laser method|seedling establishmenten_US
dc.titleDeep transfer learning based photonics sensor for assessment of seed-qualityen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Electrical Engineering

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