Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/12574
Title: Impact of Existing Deep CNN and Image Descriptors Empowered SVM Models on Fingerprint Presentation Attacks Detection
Authors: Baishya, Jyotishna
Tiwari, Prasheel Kumar
Rai, Anuj
Dey, Somnath
Keywords: Deep-learning;Fingerprint biometrics;Machine-learning;Presentation attacks
Issue Date: 2023
Publisher: Springer Science and Business Media Deutschland GmbH
Citation: Baishya, J., Tiwari, P. K., Rai, A., & Dey, S. (2023). Impact of Existing Deep CNN and Image Descriptors Empowered SVM Models on Fingerprint Presentation Attacks Detection. Springer Science and Business Media Deutschland GmbH
Scopus. https://doi.org/10.1007/978-981-99-2680-0_22
Abstract: Automatic Fingerprint Recognition Systems (AFRS) are the most widely used systems for authentication. However, they are vulnerable to Presentation Attacks (PAs). These attacks can be placed by presenting an artificial artifact of a genuine user’s fingerprint to the sensor of AFRS. As a result, Presentation Attack Detection (PAD) is essential to assure the security of fingerprint-based authentication systems. The study presented in this paper assesses the capability of various existing Deep-Learning and Machine-Learning models. We have considered four state-of-the-art Convolutional Neural Network (CNN) architectures such as MobileNet, DenseNet, ResNet, VGG as well as Support Vector Machine (SVM), trained with image descriptor features in our study. The benchmark LivDet 2013, 2015, and 2017 databases are utilized for the validation of these models. The experimental findings indicate toward the supremacy of Deep CNN models in cross-material scenario of PAs. © 2023, The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.
URI: https://doi.org/10.1007/978-981-99-2680-0_22
https://dspace.iiti.ac.in/handle/123456789/12574
ISBN: 978-9819926794
ISSN: 2367-3370
Type of Material: Conference Paper
Appears in Collections:Department of Computer Science and Engineering

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