Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/13119
Full metadata record
DC FieldValueLanguage
dc.contributor.authorKumar, Mukeshen_US
dc.date.accessioned2024-01-29T05:18:48Z-
dc.date.available2024-01-29T05:18:48Z-
dc.date.issued2023-
dc.identifier.citationKasongo, M., Ytterdal, T., Lee, J., Rizkalla, M., & Kumar, M. (2023). Evaluation of Leakage Currents in Memristor Crossbar Arrays. Proceedings of the IEEE National Aerospace Electronics Conference, NAECON. Scopus. https://doi.org/10.1109/NAECON58068.2023.10365978en_US
dc.identifier.isbn979-8350338782-
dc.identifier.issn0547-3578-
dc.identifier.otherEID(2-s2.0-85182393231)-
dc.identifier.urihttps://doi.org/10.1109/NAECON58068.2023.10365978-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/13119-
dc.description.abstractMemristors are novel electronic devices. Memristor-based crossbar arrays have gained a lot of attention for potential applications in nonvolatile memory, in-memory computing, logic design, neuromorphic computing systems, and neural networks. In this paper, we demonstrate the sneaky path current issue within a 3×3 crossbar array. 1T1M scheme has been used to reduce the leakage current. Integrating nMOS and pMOS devices in series with memristors in the crossbar array has optimized the leakage currents. The results show that nMOS devices reduce the leakage currents by 97.35%, whereas pMOS devices reduce the leakage currents by 92.20%. Thus, nMOS outperform pMOS devices in leakage currents optimization. © 2023 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceProceedings of the IEEE National Aerospace Electronics Conference, NAECONen_US
dc.subjectCMOSen_US
dc.subjectcrossbar arrayen_US
dc.subjectleakage or sneaky currenten_US
dc.subjectLTspiceen_US
dc.subjectMemristoren_US
dc.subjectnMOSen_US
dc.subjectpMOSen_US
dc.subjectsneaky path currenten_US
dc.titleEvaluation of Leakage Currents in Memristor Crossbar Arraysen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Electrical Engineering

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: