Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/13643
Full metadata record
DC FieldValueLanguage
dc.contributor.authorJoshi, Suhas S.en_US
dc.date.accessioned2024-04-26T12:43:34Z-
dc.date.available2024-04-26T12:43:34Z-
dc.date.issued2024-
dc.identifier.citationPratap, A., Kumar Katiyar, N., Fan, P., Goel, S., & Joshi, S. S. (2024). Forest hardening and Hirth lock during grinding of copper evidenced by MD simulations. Manufacturing Letters. Scopus. https://doi.org/10.1016/j.mfglet.2024.03.002en_US
dc.identifier.issn2213-8463-
dc.identifier.otherEID(2-s2.0-85187786950)-
dc.identifier.urihttps://doi.org/10.1016/j.mfglet.2024.03.002-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/13643-
dc.description.abstractThrough the use of molecular dynamics (MD) simulation, grinding process of a single crystal copper with two scratch configurations (i) near spacing (NS) between adjacent scratches, and (ii) far spacing (FS) between adjacent scratches were simulated and compared to the control sample i.e., a single scratch (SS). FS configuration revealed the highest material removal, whereas NS configuration showed that the material removal is affected by various types of defects in the sub-surface which include FCC intrinsic stacking fault, a coherent twin boundary next to an intrinsic stacking fault and two adjacent intrinsic stacking faults. The formation of a Stair-rod 1/6 ?1 1 0? due to the reaction between two Shockley partial dislocations 1/6 ?1 1 2? was seen as a distinct feature of the NS configuration which forms the onset of hardening. � 2024 The Authorsen_US
dc.language.isoenen_US
dc.publisherElsevier Ltden_US
dc.sourceManufacturing Lettersen_US
dc.subjectCopperen_US
dc.subjectDislocationen_US
dc.subjectInternal stressesen_US
dc.subjectMolecular Dynamicsen_US
dc.titleForest hardening and Hirth lock during grinding of copper evidenced by MD simulationsen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Mechanical Engineering

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: