Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/14235
Title: Reducing the Impact of DoS Attack on Static and Dynamic SE Using a Deep Learning-Based Model
Authors: Kukadiya, Purna
Jain, Trapti
Hubballi, Neminath
Keywords: Convolutional neural network (CNN);cubature Kalman filter (CKF);Current measurement;denial-of-service (DoS) attacks;hybrid state estimation (HSE);long short-term memory;measurement prediction;Packet loss;Phasor measurement units;Power measurement;Power system dynamics;Power systems;Time measurement
Issue Date: 2024
Publisher: IEEE Computer Society
Citation: Kukadiya, P., Jain, T., & Hubballi, N. (2024). Reducing the Impact of DoS Attack on Static and Dynamic SE Using a Deep Learning-Based Model. IEEE Transactions on Industrial Informatics. https://doi.org/10.1109/TII.2024.3409457
Abstract: Denial-of-service (DoS) attacks adversely impact the state estimation (SE) techniques used in power systems. Our contributions in this article are twofold. First, considering a longer duration DoS attack with continuous packet loss, an analysis is carried out on an IEEE 14 bus system to assess the performance of weighted least square (WLS) and cubature Kalman filter (CKF)-based hybrid SE. Second, a method to improve the performance of CKF under long-duration attacks by accurately predicting the synchrophasor measurements using convolutional neural network (CNN) and long short-term memory (LSTM) is proposed. CNN extracts relevant features/measurements from synchrophasor and RTU measurements. Using these extracted features, LSTM predicts all synchrophasor measurements. However, only the missing measurements are utilized from LSTM output in HSE during the attack. This renders the proposed method capable of dealing with attacks on any PMU channels. A comparison with the existing techniques showed improved performance of the proposed method. IEEE
URI: https://doi.org/10.1109/TII.2024.3409457
https://dspace.iiti.ac.in/handle/123456789/14235
ISSN: 1551-3203
Type of Material: Journal Article
Appears in Collections:Department of Computer Science and Engineering
Department of Electrical Engineering

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