Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/14720
Title: Distributed semiconductor heterojunctions of ZnO–Cu2O for ultraviolet photodetection
Authors: Kumar, Ashutosh
Kumar, Santosh C.
Mishra, Rahul Dev
Pandey, Suresh Kumar
Babu, Prem
Kumar, Mukesh
Keywords: Cu2O;Integrated photonics;Photodetection;Semiconductor heterojunction;UV-Photodetector;ZnO
Issue Date: 2024
Publisher: Elsevier B.V.
Citation: Kumar, A., Kumar, S., Mishra, R. D., Pandey, S. K., Babu, P., & Kumar, M. (2024). Distributed semiconductor heterojunctions of ZnO–Cu2O for ultraviolet photodetection. Optical Materials. Scopus. https://doi.org/10.1016/j.optmat.2024.116092
Abstract: Semiconductor heterojunctions, because of their unique optoelectronic properties, have gained significant attention for integrated photonic devices. UV photodetectors based on semiconductor heterojunctions are promising due to their enhanced light absorption, efficient charge separation, and tunable electronic properties, which collectively lead to superior sensitivity and performance. An inter-band transition-based UV photodetector utilizing Cu2O/ZnO distributed heterojunctions has been demonstrated. We propose an integrated photonic structure based on semiconductor heterojunctions in the form of Cu2O–ZnO grating for ultraviolet photodetection yielding a low dark current and improved efficiency. The Cu2O–ZnO grating heterostructure, in comparison to individual planar heterojunction, boosts light-matter interaction enabling higher absorption and enhanced responsivity. The device depicts a responsivity of 0.7A/W at 360nm wavelength. The device exhibits a broadband absorption which remains good over a broad wavelength range from 250nm to 450nm. The reported UV photodetector may find applications in environmental monitoring, UV light communication, biomedical diagnostics, and industrial safety. © 2024
URI: https://doi.org/10.1016/j.optmat.2024.116092
https://dspace.iiti.ac.in/handle/123456789/14720
ISSN: 0925-3467
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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