Please use this identifier to cite or link to this item:
https://dspace.iiti.ac.in/handle/123456789/17208
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Chattopadhyay, Sudeshna | - |
| dc.contributor.author | Kuri, Abhishek | - |
| dc.date.accessioned | 2025-11-18T14:37:31Z | - |
| dc.date.available | 2025-11-18T14:37:31Z | - |
| dc.date.issued | 2025-05-21 | - |
| dc.identifier.uri | https://dspace.iiti.ac.in:8080/jspui/handle/123456789/17208 | - |
| dc.description.abstract | [Abstract is restricted for 05 Years, due to IPR related issue] | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Department of Physics, IIT Indore | en_US |
| dc.relation.ispartofseries | MS576; | - |
| dc.subject | Physics | en_US |
| dc.title | Thin-film dielectric material for application in nanoelectronics: structural analysis for x-ray scattering [RESTRICTED THESIS-05 Years] | en_US |
| dc.type | Thesis_M.Sc | en_US |
| Appears in Collections: | Department of Physics_ETD | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Restricted Thesis.pdf Restricted Access | 44.68 kB | Adobe PDF | View/Open Request a copy |
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